Influences on Soft Error Rates in Static RAM's

IEEE Journal of Solid-State Circuits

Volumn 22, Issue 3, 1987, Pages 430-436

  Carter, Paul M ^a   Wilkins, Brian R ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS;

ALPHA-PARTICLE-INDUCED SOFT ERROR RATES (SER); CRITICAL CHARGE; SPICE SIMULATION; STATIC RANDOM ACCESS MEMORY (SRAM);

DATA STORAGE, DIGITAL;

EID: 0022733111     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.1987.1052743     Document Type: Article

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