Guidelines for predicting single-event upsets in neutron environments

IEEE Transactions on Nuclear Science

Volumn 38, Issue 6, 1991, Pages 1500-1506

  Normand, Eugene ^b  

^a Severn Communications Corporation ^*  (United States)

^b BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; GRAPHIC METHODS; NEUTRONS; SEMICONDUCTING SILICON;

SINGLE EVENT UPSETS;

SEMICONDUCTOR DEVICES;

EID: 0026382710     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.124138     Document Type: Article

References (13)

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