Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsets

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 2349-2355

  Normand, Eugene ^a   Doherty, W Ross ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; NEUTRONS--SCATTERING; TRANSISTORS, BIPOLAR;

EVALUATED NEUTRON DATA FILE (ENDF-V); SINGLE EVENT UPSETS;

INTEGRATED CIRCUITS, LSI;

EID: 0024925828     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45447     Document Type: Article

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