ANALYTICAL METHOD FOR PREDICTING CMOS SRAM UPSETS WITH APPLICATION TO ASYMMETRICAL MEMORY CELLS.

IEEE Transactions on Nuclear Science

Volumn NS-33, Issue 6, 1986, Pages

  Buehler, Martin G ^a   Allen, Richard A ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; DATA STORAGE, DIGITAL - RANDOM ACCESS; RADIATION EFFECTS - MATHEMATICAL MODELS;

SINGLE-EVENT-UPSET RATE; STATIC RAM;

DATA STORAGE, SEMICONDUCTOR;

EID: 0022865247     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)