Alpha-Particle-Induced Field and Enhanced Collection of Carriers

IEEE Electron Device Letters

Volumn 3, Issue 2, 1982, Pages 31-34

  Hu, C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS;

EID: 0020091827     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/EDL.1982.25467     Document Type: Article

References (8)

1. D. S. Yaney, J. T. Nelson and L. L. Vanskike, IEEE Trans. Electron Devices, ED-26, pp. 10-16, January 1979.
2. S. Kirkpatrick, IEEE Trans; Electron Devices, ED-26, p. 1742, November 1979.
3. C. M. Hsieh, P. C. Murley and R. R. O'Brien, IEEE Elect. Device Lett., EDL-2, p. 103, April 1981.
4. C. M. Hsieh, P. C. Murley and R. R. O'Brien, Proc. of IEEE Int'l. Reliability Physics Symposium, pp. 38-42, Orlando, Florida, April 7, 1981.
5. J. G. Fossum, E. L. Burgess and F. A. Lindholm, Solid-State Electron., vol. 21, pp. 729, 737, 1978.
6. E. J. Ryder, Phys. Rev., vol. 90. p. 766. 1953.
7. K. Terrill, University of California, Berkeley, private communication.
8. C. Hu, to be published.