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Volumn 33, Issue 11, 1998, Pages 1711-1718

A 220-mm2, four- and eight-bank, 256-Mb SDRAM with single-sided stitched WL architecture

(14)  Kirihata, Toshiaki a,c,d,e,f,g   Gall, Martin a,h,i   Hosokawa, Kohji a,f,j   Dortu, Jean Marc a,h,i,k,l   Wong, Hing a,b,m   Pfefferl, Peter a,h,n,o   Ji, Brian L a,p,q,r,s   Weinfurtner, Oliver a,h,t   DeBrosse, John K a,u   Terletzki, Hartmud a   Selz, Manfred a   Ellis, Wayne a   Wordeman, Matthew R a,b   Kiehl, Oliver a  


Author keywords

256 Mb DRAM; 256 Mb SDRAM; Asymmetric block activation; Divided column redundancy; DRAM; Flexible test mode; Frequency doubling test mode; Intraunit address increment; Memory; SDRAM; Selectable redundancy; Single ended RWD; Stitched WL architecture; Trench cell

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS; PIPELINE PROCESSING SYSTEMS;

EID: 0032205692     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.726565     Document Type: Article
Times cited : (8)

References (31)
  • 8
    • 4143093751 scopus 로고
    • 2 MIM_CROWN cell and process technologies for 1-Gb DRAM's
    • Dec.
    • 2 MIM_CROWN cell and process technologies for 1-Gb DRAM's," in IEDM Tech. Dig., Dec. 1994, pp. 927-932.
    • (1994) IEDM Tech. Dig. , pp. 927-932
    • Kaga, T.1
  • 31
    • 33746227742 scopus 로고
    • A 33-ns 64 Mb DRAM with master word line architecture
    • D. Galbi et al., "A 33-ns 64 Mb DRAM with master word line architecture," in ESSCIRC Dig. Tech. Papers. 1992, pp. 131-344.
    • (1992) ESSCIRC Dig. Tech. Papers. , pp. 131-344
    • Galbi, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.