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Nanoscale

Volumn 8, Issue 15, 2016, Pages 7949-7957

Phosphorene under electron beam: From monolayer to one-dimensional chains

(3) Vierimaa, Ville a Krasheninnikov, Arkady V a,b,c,d Komsa, Hannu Pekka a

a AALTO UNIVERSITY (Finland)

b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH (Germany)

c NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY MISIS (Russian Federation)

d TECHNICAL UNIVERSITY OF DENMARK (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHAINS; DEFECTS; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON IRRADIATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PHOSPHORUS; POINT DEFECTS; SEMICONDUCTOR DEVICE MANUFACTURE; TRANSMISSION ELECTRON MICROSCOPY;

ATOM DISPLACEMENTS; ELECTRONIC SPECTRUM; FIRST-PRINCIPLES SIMULATIONS; FOCUSED ELECTRON BEAMS; ONE-DIMENSIONAL CHAINS; SEMICONDUCTOR TECHNOLOGY; TOP-DOWN ENGINEERINGS; TWO-DIMENSIONAL MATERIALS;

ELECTRONS;

EID: 84964652322 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c6nr00179c Document Type: Article

Times cited : (65)

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