Subangstrom edge relaxations probed by electron microscopy in hexagonal boron nitride

Physical Review Letters

Volumn 109, Issue 20, 2012, Pages

  Alem, Nasim ^a,b   Ramasse, Quentin M ^c   Seabourne, Che R ^d   Yazyev, Oleg V ^a,b,e   Erickson, Kris ^a,b   Sarahan, Michael C ^c   Kisielowski, Christian ^b   Scott, Andrew J ^d   Louie, Steven G ^a,b   Zettl, A ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c SUPERSTEM LABORATORY   (United Kingdom)

^d UNIVERSITY OF LEEDS   (United Kingdom)

^e EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; BULK-LIKE; EDGE RECONSTRUCTION; EDGE RELAXATION; HEXAGONAL BORON NITRIDE; HEXAGONAL BORON NITRIDE (H-BN); INTERLAYER BONDS; NANO-ENGINEERING; OPEN EDGES; OUT-OF-PLANE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THEORETICAL RESEARCH; TWO-DIMENSIONAL CRYSTALS;

DENSITY FUNCTIONAL THEORY; ELECTRONIC STRUCTURE; GRAPHENE; TRANSMISSION ELECTRON MICROSCOPY;

BORON NITRIDE;

EID: 84870210597     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.205502     Document Type: Article

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