Electronic bandgap and edge reconstruction in phosphorene materials

Nano Letters

Volumn 14, Issue 11, 2014, Pages 6400-6406

  Liang, Liangbo ^a   Wang, Jun ^b   Lin, Wenzhi ^b   Sumpter, Bobby G ^b   Meunier, Vincent ^a   Pan, Minghu ^b,c  

^a Rensselaer Polytechnic Institute   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

density functional theory; direct bandgap; monatomic step edges; Phosphorene; scanning tunneling microscopy spectroscopy; self passivation

Indexed keywords

ANISOTROPY; CALCULATIONS; DANGLING BONDS; DENSITY FUNCTIONAL THEORY; ENERGY GAP; FLEXIBLE ELECTRONICS; HONEYCOMB STRUCTURES; SCANNING TUNNELING MICROSCOPY;

ANISOTROPIC DEFORMATION; ELECTRONIC BAND GAPS; FIRST-PRINCIPLES CALCULATION; PHOSPHORENE; SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY; SELF-PASSIVATION; SEMICONDUCTOR PROPERTIES; STEP EDGE;

PHOSPHORUS;

EID: 84910147904     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl502892t     Document Type: Article

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