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Volumn 108, Issue 19, 2012, Pages

Accurate measurement of electron beam induced displacement cross sections for single-layer graphene

(12) Meyer, Jannik C a,b Eder, Franz b Kurasch, Simon a Skakalova, Viera b,c Kotakoski, Jani b,d Park, Hye Jin c Roth, Siegmar c,e Chuvilin, Andrey a,f,g Eyhusen, Sören h Benner, Gerd h Krasheninnikov, Arkady V d,i Kaiser, Ute a

a UNIVERSITY OF ULM (Germany)

b UNIVERSITY OF VIENNA (Austria)

c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

d UNIVERSITY OF HELSINKI (Finland)

e Korea University (South Korea)

f CIC NANOGUNE (Spain)

g BASQUE FOUNDATION FOR SCIENCE (Spain)

h CARL ZEISS SMT AG (Germany)

i AALTO UNIVERSITY (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURATE MEASUREMENT; ATOMIC DISPLACEMENT; CARBON ATOMS; CHEMICAL ETCHING; CROSS SECTION; DAMAGE MECHANISM; ELECTRON-BEAM ENERGY; IONIZATION DAMAGE; LATTICE APPROXIMATIONS; SINGLE LAYER; TARGET ATOM;

ATOMS; ELECTRON BEAMS; GRAPHENE; NUCLEAR REACTIONS; RADIATION DAMAGE;

DISPLACEMENT MEASUREMENT;

EID: 84860717107 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.108.196102 Document Type: Article

Times cited : (431)

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