Quantitative electron phase imaging with high sensitivity and an unlimited field of view

Scientific Reports

Volumn 5, Issue , 2015, Pages

  Maiden, A M ^a   Sarahan, M C ^c   Stagg, M D ^b,c   Schramm, S M ^b   Humphry, M J ^b  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b Electric Works   (United Kingdom)

^c GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84942923563     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep14690     Document Type: Article

References (40)

1. Hoppe, W. Trace structure analysis, ptychography, phase tomography. Ultramicroscopy 10, 187-198 (1982).
2. Rodenburg, J. M. The phase problem, microdiffraction and wavelength-limited resolution-a discussion. Ultramicroscopy 27, 413-422 (1989).
3. Pennycook, T. J. et al. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution. Ultramicroscopy 151, 160-167 (2015).
4. Miao, J., Ishikawa, T., Robinson, I. K., Murnane, M. M. Beyond crystallography: Diffractive imaging using coherent X-ray light sources. Science 348, 530-535 (2015).
5. Rodenburg, J. M., Faulkner, H. M. L. A phase retrieval algorithm for shifting illumination. Applied Physics Letters 85, 4795-4797 (2004).
6. Guizar-Sicairos, M., Fienup, J. R. Phase retrieval with transverse translation diversity: a nonlinear optimization approach. Optics express 16, 7264-7278 (2008).
7. Thibault, P. et al. High-resolution scanning X-ray diffraction microscopy. Science 321, 379-382 (2008).
8. Maiden, A. M., Rodenburg, J. M. An improved ptychographical phase retrieval algorithm for diffractive imaging. Ultramicroscopy 109, 1256-1262 (2009).
9. Wen, Z., Yang, C., Liu, X., Marchesini, S. Alternating direction methods for classical and ptychographic phase retrieval. Inverse Problems 28, 115010, doi: 10.1088/0266-5611/28/11/115010 (2012).
10. Hesse, R., Luke, D. R., Sabach, S., Tam, M. K. Proximal Heterogeneous Block Implicit-Explicit Method and Application to Blind Ptychographic Diffraction Imaging. SIAM Journal on Imaging Sciences 8, 426-457 (2015).
11. Humphry, M., Kraus, B., Hurst, A., Maiden, A., Rodenburg, J. Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging. Nature communications 3, 730, doi: 10.1038/ncomms1733 (2012).
12. D'Alfonso, A. J. et al. Deterministic electron ptychography at atomic resolution. Physical Review B 89, 064101, doi: 10.1103/PhysRevB.89.064101 (2014).
13. McCartney, M. R., Smith, D. J. Electron holography: phase imaging with nanometer resolution. Annu. Rev. Mater. Res. 37, 729-767 (2007).
14. Huë, F., Rodenburg, J., Maiden, A., Sweeney, F., Midgley, P. Wave-front phase retrieval in transmission electron microscopy via ptychography. Physical Review B 82, 121-415, doi: 10.1103/PhysRevB.82.121415 (2010).
15. Huë, F., Rodenburg, J., Maiden, A., Midgley, P. Extended ptychography in the transmission electron microscope: Possibilities and limitations. Ultramicroscopy 111, 1117-1123 (2011).
16. Maiden, A. M., Humphry, M. J., Rodenburg, J. M. Ptychographic transmission microscopy in three dimensions using a multislice approach. Journal of the Optical Society of America A 29, 1606-1614 (2012).
17. Thibault, P., Guizar-Sicairos, M. Maximum-likelihood refinement for coherent diffractive imaging. New Journal of Physics 14, 0630-04, doi: 10.1088/1367-2630/14/6/063004 (2012).
18. Edo, T. et al. Sampling in X-ray ptychography. Physical Review A 87, 053850, doi: 10.1103/PhysRevA.87.053850 (2013).
19. Thibault, P., Menzel, A. Reconstructing state mixtures from diffraction measurements. Nature 494, 68-71 (2013).
20. Batey, D. J., Claus, D., Rodenburg, J. M. Information multiplexing in ptychography. Ultramicroscopy 138, 13-21 (2014).
21. Clark, J. N., Huang, X., Harder, R. J., Robinson, I. K. Dynamic Imaging Using Ptychography. Physical Review Letters 112, 113901, doi: 10.1103/PhysRevLett.112.113901 (2014).
22. Deng, J. et al. Continuous motion scan ptychography: characterization for increased speed in coherent X-ray imaging. Optics Express 23, 5438-5451 (2015).
23. Tripathi, A., McNulty, I., Shpyrko, O. G. Ptychographic overlap constraint errors and the limits of their numerical recovery using conjugate gradient descent methods. Optics Express 22, 1452-1466 (2014).
24. Maiden, A., Humphry, M., Sarahan, M., Kraus, B., Rodenburg, J. An annealing algorithm to correct positioning errors in ptychography. Ultramicroscopy 120, 64-72 (2012).
25. Zhang, F. et al. Translation position determination in ptychographic coherent diffraction imaging. Optics Express 21, 13592-13606 (2013).
26. Stockmar, M. et al. Near-field ptychography: phase retrieval for inline holography using a structured illumination. Sci. Rep. 3, 1927, doi:10.1038/srep01927 (2013).
27. Koch, C. T. Towards full-resolution inline electron holography. Micron 63, 69-75 (2014).
28. Burdet, N. et al. Evaluation of partial coherence correction in X-ray ptychography. Optics Express 23, 5452-5467 (2015).
29. Wang, Y. C., Chou, T. M., Libera, M., Voelkl, E., Frost, B. G. Measurement of Polystyrene Mean Inner Potential by Transmission Electron Holography of Latex Spheres. Microscopy and Microanalysis 4, 146-157 (1998).
30. Chou, T. M., Libera, M. Mean free paths for inelastic electron scattering in silicon and poly(styrene) nanospheres. Ultramicroscopy 94, 31-35 (2003).
31. Lichte, H., Lehmann, M. Electron holography-basics and applications. Reports on Progress in Physics 71, 016102, doi: 10.1088/0034-4885/71/1/016102 (2008).
32. Lichte, H. et al. Artefacts in electron holography. Ultramicroscopy 64, 67-77 (1996).
33. Koch, C. T. A flux-preserving non-linear inline holography reconstruction algorithm for partially coherent electrons. Ultramicroscopy 108, 141-150 (2008).
34. Haigh, S. J., Jiang, B., Alloyeau, D., Kisielowski, C., Kirkland, A. I. Recording low and high spatial frequencies in exit wave reconstructions. Ultramicroscopy 133, 26-34 (2013).
35. Ozsoy-Keskinbora, C., Boothroyd, C., Dunin-Borkowski, R., van Aken, P., Koch, C. Hybridization approach to in-line and off-axis (electron) holography for superior resolution and phase sensitivity. Scientific reports 4, 7020, doi: 10.1038/srep07020 (2014).
36. Robisch, A. L., Kröger, K., Rack, A., Salditt, T. Near-field ptychography using lateral and longitudinal shifts. New Journal of Physics 17, 073033, doi: 10.1088/1367-2630/17/7/073033 (2015).
37. Morishita, S., Yamasaki, J., Tanaka, N. Measurement of spatial coherence of electron beams by using a small selected-area aperture. Ultramicroscopy 129, 10-17 (2013).
38. Pozzi, G., Beleggia, M., Kasama, T., Dunin-Borkowski, R. E. Interferometric methods for mapping static electric and magnetic fields. Comptes Rendus Physique 15, 126-139 (2014).
39. Twitchett, A., Dunin-Borkowski, R., Midgley, P. Quantitative electron holography of biased semiconductor devices. Physical review letters 88, 238302, doi: 10.1103/PhysRevLett.88.238302 (2002).
40. Hytch, M., Houdellier, F., Hue, F., Snoeck, E. Nanoscale holographic interferometry for strain measurements in electronic devices. Nature 453, 1086-1089 (2008).