Towards full-resolution inline electron holography

Micron

Volumn 63, Issue , 2014, Pages 69-75

  Koch, Christoph T ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

Inline holography; Phase retrieval; TEM

Indexed keywords

TRANSMISSION ELECTRON MICROSCOPY; ELECTRON HOLOGRAPHY; ELECTRON MICROSCOPY; HOLOGRAPHY; WAVE FUNCTIONS;

ELECTRON WAVE FUNCTIONS; FOCAL SERIES RECONSTRUCTION; IN-LINE ELECTRON HOLOGRAPHY; IN-LINE HOLOGRAPHY; PHASE RETRIEVAL; SPATIAL FREQUENCY; TRANSMISSION ELECTRON MICROSCOPY IMAGES;

ELECTRON HOLOGRAPHY; ELECTRONS;

EID: 84901585258     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2013.10.009     Document Type: Article

References (26)

1. Özdöl V.B., Koch C.T., van Aken P.A. A nondamaging electron microscopy approach to map In distribution in InGaN light-emitting diodes. J. Appl. Phys. 2010, 108:056103.
2. Allen L.J., Oxley M.P. Phase retrieval from series of images obtained by defocus variation. Opt. Commun. 2001, 199:65-75.
3. Allen L.J., McBride W., O'Leary N.L., Oxley M.P. Exit wave reconstruction at atomic resolution. Ultramicroscopy 2004, 100:91-104.
4. Buist A.H., van den Bos A., Miedema M.A.O. Optimal experimental design for exit wave reconstruction from focal series in tem. Ultramicroscopy 1996, 64:137-152.
5. Coene W.M.J., Thust A., Op de Beek M., Van Dyck D. Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 1996, 64:109-135.
6. Gabor D. A new microscopic principle. Nature 1948, 161:777-778.
7. Gureyev T.E. Composite techniques for phase retrieval in the fresnel region. Opt. Commun. 2003, 220:49-58.
8. Haigh S.J., Jiang B., Alloyeau D., Kisielowski C., Kirkland A.I. Recording low and high spatial frequencies in exit wave reconstructions. Ultramicroscopy 2013, 133:26-34.
9. Hsieh W.-K., Chen F.-R., Kai J.-J., Kirkland A.I. Resolution extension and exit wave reconstruction in complex HREM. Ultramicroscopy 2004, 98:99-114.
10. Ishizuka K., Allman B. Phase measurement of atomic resolution image using transport of intensity equation. J. Electr. Microsc. 2005, 54:191-197.
11. Kawasaki T., Takai Y., Ikuta T., Shimizu R. Wave field restoration using three-dimensional Fourier filtering method. Ultramicroscopy 2001, 90:47-59.
12. Kirkland A.I., Saxton W.O., Chau K.L., Tsuno K., Kawasaki M. Super-resolution by aperture synthesis: tilt series reconstruction in ctem. Ultramicroscopy 1995, 57:355-374.
13. Kirkland E.J. Improved high resolution image processing of bright field electron micrographs. Ultramicroscopy 1984, 15:151-172.
14. Koch C.T., Lubk A. Off-axis and inline electron holography: a quantitative comparison. Ultramicroscopy 2010, 110:460-471.
15. Koch C.T., Sigle W., Höschen R., Rühle M., Essers E., Benner G., Matijevic M. Sesam: exploring the frontiers of electron microscopy. Microsc. Microanal. 2006, 12:506-514.
16. Koch C.T. A flux-preserving inline electron holography reconstruction algorithm for illumination of partial spatial coherence. Ultramicroscopy 2008, 108:141-150.
17. Koch C.T. Full-resolution inline electron holography (frih). European Microscopy Congress EMC2012 2012, 139.
18. Latychevskaia T., Formanek P., Koch C.T., Lubk A. Off-axis and inline electron holography: experimental comparison. Ultramicroscopy 2010, 110:472-482.
19. Miedema M.A.O., van den Bos A., Buist A.H. Experimental design of exit wave reconstruction from a transmission electron microscope defocus series. IEEE Trans. Instrum. Meas. 1994, 43:181-186.
20. Morgan A.J., Martin A.V., D'alfonso A.J., Putkunz C.T., Allen L.J. Direct exit-wave reconstruction from a single defocused image. Ultramicroscopy 2011, 111:1455-1460.
21. Op de Beek M., van Dyck D., Coene W.M.J. Wave function reconstruction in HRTEM: the parabola method. Ultramicroscopy 1996, 64:167-183.
22. Ophus C., Ewalds T. Guidelines for quantitative reconstruction of complex exit waves in hrtem. Ultramicroscopy 2012, 113:88.
23. Paganin D., Nugent K.A. Noninterferometric phase imaging with partially coherent light. Phys. Rev. Lett. 1998, 80:2586-2589.
24. Song K., Shin G.Y., Kim J.K., Oh S.H., Koch C.T. Strain mapping of led devices by dark-field inline electron holography: comparison between deterministic and iterative phase retrieval approaches. Ultramicroscopy 2013, 127:119-125.
25. Teague M. Deterministic phase retrieval: a green's function solution. J. Opt. Soc. Am. 1983, 73:1434-1441.
26. Thust A., Coene W.M.J., Op de Beek M., van Dyck D. Focal-series reconstruction in hrtem: simulation studies on non-periodic objects. Ultramicroscopy 1996, 64:211-230.