An annealing algorithm to correct positioning errors in ptychography

Ultramicroscopy

Volumn 120, Issue , 2012, Pages 64-72

  Maiden, A M ^a,b   Humphry, M J ^b   Sarahan, M C ^c   Kraus, B ^c   Rodenburg, J M ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b Electric Works   (United Kingdom)

^c GATAN INC   (United States)

Author keywords

Coherent diffractive imaging; Phase retrieval; Ptychography

Indexed keywords

ANGULAR SIZES; ANNEALING ALGORITHM; ATOMIC SCALE; COMPUTATIONALLY EFFICIENT; DIFFRACTIVE IMAGING; HIGH QUALITY; NUMERICAL APERTURE; PHASE RETRIEVAL; PIXEL SIZE; POSITIONING ERROR; PTYCHOGRAPHY; RECONSTRUCTION ALGORITHMS; THERMAL DRIFTS; TRANSMISSION MICROSCOPY; VISIBLE LIGHT;

ALGORITHMS; ELECTRON BEAMS;

ERRORS;

ACCURACY; ALGORITHM; ARTICLE; CALCULATION; DIFFRACTION; ELECTRON BEAM; ELECTRON MICROSCOPY; ILLUMINATION; IMAGE ANALYSIS; IMAGING; LIGHT; PTYCHOGRAPHY; SIMULATION;

EID: 84864071913     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.06.001     Document Type: Article

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