In Situ Microstructural Control and Mechanical Testing Inside the Transmission Electron Microscope at Elevated Temperatures

JOM

Volumn 67, Issue 8, 2015, Pages 1713-1720

  Wang, Baoming ^a   Haque, M A ^a  

^a The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; ENERGY DISSIPATION; GRAIN GROWTH; MATERIALS TESTING; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC SCALE IMAGING; ELEVATED TEMPERATURE; ENERGY-LOSS SPECTROSCOPY; FUNDAMENTAL MECHANISMS; INTERNAL MICROSTRUCTURE; MICROSTRUCTURAL CONTROL; POST MORTEM ANALYSIS; REAL TIME VISUALIZATION;

MECHANICAL TESTING;

EID: 84938976874     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/s11837-015-1459-8     Document Type: Article

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