Transmission electron microscopy

Practical Materials Characterization

Volumn , Issue , 2014, Pages 189-229

  Wen, Jian Guo ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; SPECIMEN PREPARATION; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION-CORRECTED STEM; CHROMATIC ABERRATION; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); DIFFRACTION-CONTRAST IMAGING; HIGH-ANGLE ANNULAR DARK-FIELD IMAGING; HIGH-RESOLUTION TEM; NANOBEAM ELECTRON DIFFRACTION; SELECTED AREA DIFFRACTION;

ELECTRONS;

EID: 84955391514     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-1-4614-9281-8_5     Document Type: Chapter

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