In situ lift-out dedicated techniques using FIB-SEM system for TEM specimen preparation

Micron

Volumn 44, Issue 1, 2013, Pages 115-119

  Tomus, Dacian ^a   Ng, Hoi Pang ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

FIB milling; In situ lift out; Site specific TEM specimen preparation; TEM observation

Indexed keywords

AL ALLOYS; CONSTITUENT PHASIS; CRYSTALLOGRAPHIC ORIENTATIONS; ELECTRON BACK SCATTER DIFFRACTION; FIB MILLING; LIFT-OUT TECHNIQUES; ORIENTATION RELATIONSHIP; POWDER PARTICLES; SECONDARY ELECTRON IMAGING; SITE-SPECIFIC; TEM OBSERVATIONS; THIN FOIL; TI-SI ALLOY; TRANSMISSION ELECTRON MICROSCOPY TEM;

GRAIN BOUNDARIES; HYDROGEN; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

SPECIMEN PREPARATION;

EID: 84870667773     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2012.05.006     Document Type: Article

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