Electromigration stress induced deformation mechanisms in free-standing platinum thin films

Scripta Materialia

Volumn 65, Issue 4, 2011, Pages 277-280

  Kumar, S ^a   Alam, M T ^a   Connell, Z ^b   Haque, M A ^a  

^a The Pennsylvania State University   (United States)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

Electromigration; Grain growth; Nanocrystalline microstructure; Transmission electron microscopy

Indexed keywords

DEFORMATION MECHANISM; EXPERIMENTAL EVIDENCE; GRAIN ROTATION; GRAIN SIZE; GRAIN-BOUNDARY MOBILITY; NANOCRYSTALLINE MICROSTRUCTURES; NEAR ROOM TEMPERATURE; PLATINUM FILMS; PLATINUM THIN FILM; STRESS-INDUCED DEFORMATION; TRANSMISSION ELECTRON;

DEFORMATION; ELECTROMIGRATION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PLATINUM; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

GRAIN GROWTH;

EID: 79958239561     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2011.04.030     Document Type: Article

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