Quantitative in-situ TEM study of stress-assisted grain growth

MRS Communications

Volumn 3, Issue 2, 2013, Pages 101-105

  Kumar, Sandeep ^a   Alam, Tarek ^b   Haque, Aman ^b  

^a University of California Riverside   (United States)

^b The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN BOUNDARIES; IN SITU PROCESSING; TRANSMISSION ELECTRON MICROSCOPY;

FAR-FIELD STRESS; GRAIN BOUNDARY MOTIONS; IN-SITU TEM; INTERFACE MOTIONS; MIS-ORIENTATION; PLATINUM THIN FILM; QUANTITATIVE MEASUREMENT; REAL TIME;

GRAIN GROWTH;

EID: 84924059436     PISSN: 21596859     EISSN: 21596867     Source Type: Journal    
DOI: 10.1557/mrc.2013.15     Document Type: Article

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