A microelectromechanical system for thermomechanical testing of nanostructures

Applied Physics Letters

Volumn 103, Issue 26, 2013, Pages

  Chang, Tzu Hsuan ^a   Zhu, Yong ^a  

^a North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLE-TO-DUCTILE TRANSITION; ELEVATED TEMPERATURE; MEASUREMENT-BASED; MICRO ELECTROMECHANICAL SYSTEM (MEMS); MULTIPHYSICS SIMULATIONS; SINGLE CRYSTALLINE SILICON; TEMPERATURE SIMULATIONS; THERMO-MECHANICAL TESTING;

MECHANICAL PROPERTIES; MECHANICAL TESTING; MEMS; MICROMECHANICS; NANOWIRES;

ELECTROMECHANICAL DEVICES;

EID: 84891615910     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4858962     Document Type: Article

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