-
1
-
-
0000943087
-
Optical and electronic properties of Si nanoclusters synthesized in inverse micelles
-
J.P. Wilcoxon, G.A. Samara, and P.N. Provencio Optical and electronic properties of Si nanoclusters synthesized in inverse micelles Phys. Rev. B 60 1999 2704 2714
-
(1999)
Phys. Rev. B
, vol.60
, pp. 2704-2714
-
-
Wilcoxon, J.P.1
Samara, G.A.2
Provencio, P.N.3
-
3
-
-
0015481573
-
Characterization of thin-oxide MNOS memory transistors
-
M.H. White, and J.R. Cricchi Characterization of thin-oxide MNOS memory transistors IEEE T. Electron Dev. 19 1972 1280 1288
-
(1972)
IEEE T. Electron Dev.
, vol.19
, pp. 1280-1288
-
-
White, M.H.1
Cricchi, J.R.2
-
5
-
-
0001088358
-
22.8% efficient silicon solar cell
-
A.W. Blakers, A. Wang, A.M. Milne, J. Zhao, and M.A. Green 22.8% efficient silicon solar cell Appl. Phys. Lett. 55 1989 1363 1365
-
(1989)
Appl. Phys. Lett.
, vol.55
, pp. 1363-1365
-
-
Blakers, A.W.1
Wang, A.2
Milne, A.M.3
Zhao, J.4
Green, M.A.5
-
7
-
-
0034268858
-
Surface passivation of crystalline silicon solar cells
-
A. Aberle Surface passivation of crystalline silicon solar cells Prog. Photovoltaics 8 2000 473 487
-
(2000)
Prog. Photovoltaics
, vol.8
, pp. 473-487
-
-
Aberle, A.1
-
8
-
-
0017456928
-
Annealing of surface states in polycrystalline-silicon-gate capacitors
-
T.W. Hickmott Annealing of surface states in polycrystalline-silicon-gate capacitors J. Appl. Phys. 48 1977 723 733
-
(1977)
J. Appl. Phys.
, vol.48
, pp. 723-733
-
-
Hickmott, T.W.1
-
9
-
-
0037570641
-
2 on Si: An ion-beam study
-
2 on Si: an ion-beam study J. Appl. Phys. 61 1987 5428 5437
-
(1987)
J. Appl. Phys.
, vol.61
, pp. 5428-5437
-
-
Myer, S.M.1
-
10
-
-
36449002905
-
Recrd low surface recombination velocities on 1 cm psillicon using remote plasma silicon nitride passivation
-
T. Lauinger, J. Schmidt, A.G. Aberie, and R. Hezel Recrd low surface recombination velocities on 1 cm psillicon using remote plasma silicon nitride passivation Appl. Phys. Lett. 68 1996 1232 1234
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 1232-1234
-
-
Lauinger, T.1
Schmidt, J.2
Aberie, A.G.3
Hezel, R.4
-
13
-
-
33747167944
-
Method of observation of low density interface states by means of X-ray photoelectron spectroscopy under bias and passivation by cyanide ions
-
H. Kobayashi, T. Sakurai, Y. Yamashita, T. Kubota, O. Maida, and M. Takahashi Method of observation of low density interface states by means of X-ray photoelectron spectroscopy under bias and passivation by cyanide ions Appl. Surf. Sci. 252 2006 7700 7712
-
(2006)
Appl. Surf. Sci.
, vol.252
, pp. 7700-7712
-
-
Kobayashi, H.1
Sakurai, T.2
Yamashita, Y.3
Kubota, T.4
Maida, O.5
Takahashi, M.6
-
14
-
-
33646863666
-
Methods f observation and elimination of semiconductor defect sites
-
H. Kobayashi, Y.-L. Liu, A. Asano, Y. Yamashita, J. Ivanco, and M. Takahashi Methods f observation and elimination of semiconductor defect sites Sol. Energy 80 2006 645 652
-
(2006)
Sol. Energy
, vol.80
, pp. 645-652
-
-
Kobayashi, H.1
Liu, Y.-L.2
Asano, A.3
Yamashita, Y.4
Ivanco, J.5
Takahashi, M.6
-
15
-
-
30344440145
-
Silicon cleaning and defect passivation effects of hydrogen cyanide aqueous solutions
-
M. Takahashi, Y.-L. Liu, N. Fujiwara, H. Iwasa, and H. Kobayashi Silicon cleaning and defect passivation effects of hydrogen cyanide aqueous solutions Solid State Commun. 137 2006 263 267
-
(2006)
Solid State Commun.
, vol.137
, pp. 263-267
-
-
Takahashi, M.1
Liu, Y.-L.2
Fujiwara, N.3
Iwasa, H.4
Kobayashi, H.5
-
16
-
-
84893754449
-
Metal removal and defect passivation on Si wafers for solar cell use by HCN treatments
-
K. Kimura, M. Takahashi, and H. Kobayashi Metal removal and defect passivation on Si wafers for solar cell use by HCN treatments ECS J. Solid State Sci. Technol 3 2013 Q11 Q15
-
(2013)
ECS J. Solid State Sci. Technol
, vol.3
, pp. Q11-Q15
-
-
Kimura, K.1
Takahashi, M.2
Kobayashi, H.3
-
18
-
-
0001413530
-
Resistivity, mobility, and impurity levels in GaAs, Ge, and Si at 300 °k
-
S.M. Sze, and J.C. Irvin Resistivity, mobility, and impurity levels in GaAs, Ge, and Si at 300 °K Solid State Electron. 11 1968 599 602
-
(1968)
Solid State Electron.
, vol.11
, pp. 599-602
-
-
Sze, S.M.1
Irvin, J.C.2
-
20
-
-
84887322736
-
Improvement of minority carrier lifetime by HCN treatments
-
T. Matsumoto, W. Kai, T. Fukushima, M. Takahashi, A. Ishibashi, and H. Kobayashi Improvement of minority carrier lifetime by HCN treatments ECS J. Solid State Sci. Technol 2 2013 Q127 Q130
-
(2013)
ECS J. Solid State Sci. Technol
, vol.2
, pp. Q127-Q130
-
-
Matsumoto, T.1
Kai, W.2
Fukushima, T.3
Takahashi, M.4
Ishibashi, A.5
Kobayashi, H.6
-
21
-
-
37549069357
-
Complete removal of copper contaminants on bare silicon surfaces by use of HCN aqueous solutions
-
H. Narita, M. Takahashi, H. Iwasa, and H. Kobayashi Complete removal of copper contaminants on bare silicon surfaces by use of HCN aqueous solutions J. Electrochem. Soc. 155 2008 H103 H107
-
(2008)
J. Electrochem. Soc.
, vol.155
, pp. H103-H107
-
-
Narita, H.1
Takahashi, M.2
Iwasa, H.3
Kobayashi, H.4
-
22
-
-
0021461773
-
Interface states and fixed changes in MNOS structures with APCVD and plasma silicon nitride
-
R. Hezel, K. Blumenstock, and R. Schörner Interface states and fixed changes in MNOS structures with APCVD and plasma silicon nitride J. Electrochem. Soc. 131 1984 1679 1683
-
(1984)
J. Electrochem. Soc.
, vol.131
, pp. 1679-1683
-
-
Hezel, R.1
Blumenstock, K.2
Schörner, R.3
-
24
-
-
84860499080
-
Advances in the surface pasivation of silicon solar cells
-
J. Schmidt, F. Werner, B. Veith, D. Zielke, S. Steingrube, P.P. Altermatt, S. Gatz, T. Dullweber, and R. Brendel Advances in the surface pasivation of silicon solar cells Energ. Procedia 15 2012 30 39
-
(2012)
Energ. Procedia
, vol.15
, pp. 30-39
-
-
Schmidt, J.1
Werner, F.2
Veith, B.3
Zielke, D.4
Steingrube, S.5
Altermatt, P.P.6
Gatz, S.7
Dullweber, T.8
Brendel, R.9
-
26
-
-
66549096840
-
2 layer with an extremely low leakage current density formed in high concentration nitric acid
-
2 layer with an extremely low leakage current density formed in high concentration nitric acid J. Appl. Phys. 105 2009 (103709-1-6)
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 103709-16
-
-
Kim, W.-B.1
Matsumoto, T.2
Kobayashi, H.3
-
27
-
-
50249084391
-
2 layer on atomically flat Si(111) surfaces with excellent electrical characteristics formed by nitric acid oxidation method
-
2 layer on atomically flat Si(111) surfaces with excellent electrical characteristics formed by nitric acid oxidation method Appl. Phys. Lett. 93 2008 (072101-1-3)
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 072101-13
-
-
Kim, W.-B.1
Asuha, T.2
Matsumoto, H.3
Kobayashi, U.4
-
29
-
-
0346961325
-
Nitric acid oxidation of Si toform ultrathin silicon dioxide layers with a low leakage current density
-
H. Kobayashi, Asuha, O. Maida, M. Takahashi, and H. Iwasa Nitric acid oxidation of Si toform ultrathin silicon dioxide layers with a low leakage current density J. Appl. Phys. 94 2003 7328 7335
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 7328-7335
-
-
Kobayashi, H.1
Asuha2
Maida, O.3
Takahashi, M.4
Iwasa, H.5
-
30
-
-
79956042601
-
Ultrathin silicon dioxide layers with a low leakage current density formed by chemical oxidation of Si
-
Asuha. T. Kobayashi, O. Maida, M. Inoue, M. Takahashi, Y. Todokoro, and H. Kobayashi Ultrathin silicon dioxide layers with a low leakage current density formed by chemical oxidation of Si Appl. Phys. Lett. 81 2002 3410 3412
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 3410-3412
-
-
Kobayashi Asuha., T.1
Maida, O.2
Inoue, M.3
Takahashi, M.4
Todokoro, Y.5
Kobayashi, H.6
-
31
-
-
79951821369
-
Ultra-low power TFTs with 10 nm stacked gate insulator fabricated by nitric acid oxidation of Si (NAOS) method
-
T. Matsumoto, M. Yamada, H. Tsuji, K. Taniguchi, Y. Kubota, S. Imai, S. Terakawa, H. Kobayashi, Ultra-low power TFTs with 10 nm stacked gate insulator fabricated by nitric acid oxidation of Si (NAOS) method, in: IEEE International Electron Devices Meeting, 2010, p. 21.2.1-4.
-
(2010)
IEEE International Electron Devices Meeting
, pp. 2121-4
-
-
Matsumoto, T.1
Yamada, M.2
Tsuji, H.3
Taniguchi, K.4
Kubota, Y.5
Imai, S.6
Terakawa, S.7
Kobayashi, H.8
-
32
-
-
79960875452
-
Nitric acid oxidation to form a gate oxide layer in sub-micrometer TFT
-
T. Matsumoto, Y. Kubota, S. Imai, and H. Kobayashi Nitric acid oxidation to form a gate oxide layer in sub-micrometer TFT Electrochem. Soc. T. 35 2011 217 227
-
(2011)
Electrochem. Soc. T.
, vol.35
, pp. 217-227
-
-
Matsumoto, T.1
Kubota, Y.2
Imai, S.3
Kobayashi, H.4
-
33
-
-
84903743547
-
Improvement of minority carrier lifetime and Si solar cell characteristics by nitric acid oxidation method
-
F. Shibata, D. Ishibashi, S. Ogawara, T. Matsumoto, C.-H. Kim, and H. Kobayashi Improvement of minority carrier lifetime and Si solar cell characteristics by nitric acid oxidation method J. Solid State Sci. Technol 3 2014 Q137 Q141
-
(2014)
J. Solid State Sci. Technol
, vol.3
, pp. Q137-Q141
-
-
Shibata, F.1
Ishibashi, D.2
Ogawara, S.3
Matsumoto, T.4
Kim, C.-H.5
Kobayashi, H.6
-
35
-
-
0001188528
-
An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes
-
L.M. Terman An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes Solid State Electron. 5 1962 285 299
-
(1962)
Solid State Electron.
, vol.5
, pp. 285-299
-
-
Terman, L.M.1
-
37
-
-
0019607585
-
Siliconnitride for the improvement of silicon inversion layer solar cells
-
R. Hezel Siliconnitride for the improvement of silicon inversion layer solar cells Solid-State Electron. 24 1981 863 868
-
(1981)
Solid-State Electron.
, vol.24
, pp. 863-868
-
-
Hezel, R.1
-
38
-
-
13544273595
-
Low temperature surface passivation for silicon solar cells
-
C. Leguijt, P. Lölgen, J.A. Eikelboom, A.W. Weeber, F.M. Schuurmans, W.C. Sinke, P.F.A. Alkemade, P.M. Sarro, C.H.M. Marée, and L.A. Verhoef Low temperature surface passivation for silicon solar cells Sol. Energ. Mat. Sol. C. 40 1996 297 345
-
(1996)
Sol. Energ. Mat. Sol. C.
, vol.40
, pp. 297-345
-
-
Leguijt, C.1
Lölgen, P.2
Eikelboom, J.A.3
Weeber, A.W.4
Schuurmans, F.M.5
Sinke, W.C.6
Alkemade, P.F.A.7
Sarro, P.M.8
Marée, C.H.M.9
Verhoef, L.A.10
-
39
-
-
33751520683
-
Mechanism of carrier transport in highly efficient solar cells having indium tin oxide/Si junctions
-
H. Kobayashi, T. Ishida, Y. Nakato, and H. Tsubomura Mechanism of carrier transport in highly efficient solar cells having indium tin oxide/Si junctions J. Appl. Phys. 69 1991 1736 1743
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 1736-1743
-
-
Kobayashi, H.1
Ishida, T.2
Nakato, Y.3
Tsubomura, H.4
-
41
-
-
45549117634
-
A reassessment of electron escape depths in silicon and thermally grown silicon dioxide thin films
-
M.F. Hochella Jr., and A.H. Carim A reassessment of electron escape depths in silicon and thermally grown silicon dioxide thin films Surf. Sci 197 1988 L260 L268
-
(1988)
Surf. Sci
, vol.197
, pp. L260-L268
-
-
Hochella, Jr.M.F.1
Carim, A.H.2
-
42
-
-
0001614074
-
Electronic structure of hydrogenated and unhydrogenated amorphous SiNx (0≤x≤1.6): A photoemission study
-
R. Kärcher, L. Ley, and R.L. Johnson Electronic structure of hydrogenated and unhydrogenated amorphous SiNx (0≤x≤1.6): a photoemission study Phys. Rev. B 30 1984 1896 1910
-
(1984)
Phys. Rev. B
, vol.30
, pp. 1896-1910
-
-
Kärcher, R.1
Ley, L.2
Johnson, R.L.3
-
43
-
-
0029352795
-
Magnetically excited plasma oxynitridation of Si at room temperature
-
Y. Okamoto, H. Nagasawa, D. Kitayama, H. Kitajima, and H. Ikoma Magnetically excited plasma oxynitridation of Si at room temperature Jpn. J. Appl. Phys. 34 1995 L955 L957
-
(1995)
Jpn. J. Appl. Phys.
, vol.34
, pp. L955-L957
-
-
Okamoto, Y.1
Nagasawa, H.2
Kitayama, D.3
Kitajima, H.4
Ikoma, H.5
-
44
-
-
0035800990
-
Surface modification of silicon related materials using a catalytic CVD system for ULSI applications
-
A. Izumi Surface modification of silicon related materials using a catalytic CVD system for ULSI applications Thin Solid Films 395 2001 260 265
-
(2001)
Thin Solid Films
, vol.395
, pp. 260-265
-
-
Izumi, A.1
-
46
-
-
0001424378
-
Nitridation of silicon oxide layers by nitrogen plasma generated by low energy electron impact
-
H. Kobayashi, T. Mizokuro, Y. Nakato, K. Yoneda, and Y. Todokoro Nitridation of silicon oxide layers by nitrogen plasma generated by low energy electron impact Appl. Phys. Lett. 71 1997 1978 1980
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 1978-1980
-
-
Kobayashi, H.1
Mizokuro, T.2
Nakato, Y.3
Yoneda, K.4
Todokoro, Y.5
|