Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy

Micron

Volumn 68, Issue , 2015, Pages 186-193

  Kisielowski, C ^a   Specht, P ^b   Gygax, S M ^b   Barton, B ^a   Calderon, H A ^c   Kang, J H ^d   Cieslinski, R ^d  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b University of California Berkeley   (United States)

^c INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^d DOW CHEMICAL COMPANY   (United States)

Author keywords

Aberration correction; Catalysis; Functionality; Low dose imaging; Single atom sensitivity; TEM

Indexed keywords

EID: 84914146671     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2014.07.010     Document Type: Article

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