Direct structure inversion from exit waves. Part I: Theory and simulations

Ultramicroscopy

Volumn 110, Issue 5, 2010, Pages 527-534

  Wang, A ^a   Chen, F R ^b   Van Aert, S ^a   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Argand plot; Channelling theory; Electron scattering; Image simulation; Structure determination

Indexed keywords

ARGAND PLOT; DEFOCUS; DYNAMIC SCATTERING; EXIT PLANES; QUANTITATIVE STRUCTURES; SINGLE ATOMS; ZONE AXIS;

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; SULFUR COMPOUNDS; SURFACE ROUGHNESS;

ATOMS;

ABSORPTION; AMPLITUDE MODULATION; ARTICLE; ATOM; ELECTRON; MATHEMATICAL ANALYSIS; SIMULATION; THEORY; WAVEFORM;

EID: 77952320545     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.024     Document Type: Article

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