-
1
-
-
72449128239
-
Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy
-
Alem, N., Erni, R., Kisielowski, C., Rossell,M.D., Gannett,W. & Zettl, A.2009!. Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy. Phys Rev B 80, 1554259.
-
(2009)
Phys Rev B
, vol.80
, pp. 1554259
-
-
Alem, N.1
Erni, R.2
Kisielowski, C.3
Rossell, M.D.4
Gannett, W.5
Zettl, A.6
-
2
-
-
79952963217
-
Probing the out-of-plane distortion of single point defects in atomically thin hexagonal boron nitride at the picometer scale
-
Alem, N., Yazyev, O.V., Kisielowski, C., Denes, P., Dahmen, U., Hartel, P., Haider,M., Bischoff, M., Jiang, B., Louie, S.G. & Zettl, A.2011!. Probing the out-of-plane distortion of single point defects in atomically thin hexagonal boron nitride at the picometer scale. Phys Rev Lett 106, 126102.
-
(2011)
Phys Rev Lett
, vol.106
, pp. 126102
-
-
Alem, N.1
Yazyev, O.V.2
Kisielowski, C.3
Denes, P.4
Dahmen, U.5
Hartel, P.6
Haider, M.7
Bischoff, M.8
Jiang, B.9
Louie, S.G.10
Zettl, A.11
-
3
-
-
69549110293
-
Atomic-resolution three-dimensional imaging of germanium self-interstitials near a surface: Aberration-corrected transmission electron microscopy
-
Alloyeau, D., Freitag, B., Dag, S., Wang, L.W. & Kisielowski, C.2009!. Atomic-resolution three-dimensional imaging of germanium self-interstitials near a surface: Aberration-corrected transmission electron microscopy. Phys Rev B 80, 014114.
-
(2009)
Phys Rev B
, vol.80
, pp. 014114
-
-
Alloyeau, D.1
Freitag, B.2
Dag, S.3
Wang, L.W.4
Kisielowski, C.5
-
4
-
-
76749153367
-
Radiation damage effects at four specimen temperatures from 4 to 100 K
-
Bammes, B.E., Jakana, J., Schmid, M.F. & Chiu, W.2010!. Radiation damage effects at four specimen temperatures from 4 to 100 K. J Struct Biol 169, 331-341.
-
(2010)
J Struct Biol
, vol.169
, pp. 331-341
-
-
Bammes, B.E.1
Jakana, J.2
Schmid, M.F.3
Chiu, W.4
-
5
-
-
84858623454
-
Atomic resolution at 50-300 kV obtained using low dose rate HRTEM
-
Barton, B., Song, C. & Kisielowski, C.2011!. Atomic resolution at 50-300 kV obtained using low dose rate HRTEM. Microsc Microanal 17, 1266-1267.
-
(2011)
Microsc Microanal
, vol.17
, pp. 1266-1267
-
-
Barton, B.1
Song, C.2
Kisielowski, C.3
-
6
-
-
69249133461
-
Cluster imaging with a direct detection CMOS pixel sensor in transmission electron microscopy
-
Battaglia, M., Contarato, D., Denes, P. & Giubilato, P.2009!. Cluster imaging with a direct detection CMOS pixel sensor in transmission electron microscopy. Nucl Instrum Methods Phys Res A 608, 363-365.
-
(2009)
Nucl Instrum Methods Phys Res A
, vol.608
, pp. 363-365
-
-
Battaglia, M.1
Contarato, D.2
Denes, P.3
Giubilato, P.4
-
7
-
-
70349433770
-
Background, status and future of the transmission electron aberration-corrected microscope project
-
Dahmen, U., Erni, R., Radmilovic, V., Kisielowski, C., Rossell, M.-D. & Denes, P.2009!. Background, status and future of the transmission electron aberration-corrected microscope project. Phil Trans R Soc A 367, 3795-3808.
-
(2009)
Phil Trans R Soc A
, vol.367
, pp. 3795-3808
-
-
Dahmen, U.1
Erni, R.2
Radmilovic, V.3
Kisielowski, C.4
Rossell, M.-D.5
Denes, P.6
-
8
-
-
2342561300
-
Radiation damage in the TEM and SEM
-
Egerton, R.F., Li, P. & Malac, M.2004!. Radiation damage in the TEM and SEM. Micron 35, 399-409.
-
(2004)
Micron
, vol.35
, pp. 399-409
-
-
Egerton, R.F.1
Li, P.2
Malac, M.3
-
10
-
-
0001444683
-
Lattice dynamical Debye- Waller factor for silicon
-
Flensburg, C. & Stewart, R.F.1999!. Lattice dynamical Debye- Waller factor for silicon. Phys Rev B 60, 284-291.
-
(1999)
Phys Rev B
, vol.60
, pp. 284-291
-
-
Flensburg, C.1
Stewart, R.F.2
-
11
-
-
81055154919
-
Thermal diffuse scattering in transmission electron microscopy
-
Forbes, B.D., D'Alfonso, A.J., Findlay, S.D., Van Dyck, D., LeBeau, J.M., Stemmer, S. & Allen, L.J.2011!. Thermal diffuse scattering in transmission electron microscopy. Ultramicroscopy 111, 1670-1680.
-
(2011)
Ultramicroscopy
, vol.111
, pp. 1670-1680
-
-
Forbes, B.D.1
D'Alfonso, A.J.2
Findlay, S.D.3
Van Dyck, D.4
LeBeau, J.M.5
Stemmer, S.6
Allen, L.J.7
-
12
-
-
49549094933
-
First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage
-
Freitag, B., Knippels, G., Kujawa, S., Van der Stam, M., Hubert, D., Tiemeijer, P.C., Kisielowski, C., Denes, P., Minor, A. & Dahmen, U.2008!. First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage. Micros Microanal 14(S2!, 1370-1371.
-
(2008)
Micros Microanal
, vol.14
, Issue.S2
, pp. 1370-1371
-
-
Freitag, B.1
Knippels, G.2
Kujawa, S.3
Van Der Stam, M.4
Hubert, D.5
Tiemeijer, P.C.6
Kisielowski, C.7
Denes, P.8
Minor, A.9
Dahmen, U.10
-
13
-
-
0032560108
-
Electron microscopy image enhanced
-
Haider, M., Uhlemann, S., Schwan, E., Rose, H., Kabius, B. & Urban, K.1998!. Electron microscopy image enhanced. Nature 392, 768-769.
-
(1998)
Nature
, vol.392
, pp. 768-769
-
-
Haider, M.1
Uhlemann, S.2
Schwan, E.3
Rose, H.4
Kabius, B.5
Urban, K.6
-
14
-
-
80054030003
-
Atomic-scale edge structures on industrial-style MoS2 nanocatalysts
-
Hansen, L.P., Ramasse, Q.M., Kisielowski, C., Brorson, M., Johnson, E., Topsøe, H. & Helveg, S.2011!. Atomic-scale edge structures on industrial-style MoS2 nanocatalysts. Angew Chem Int Ed 50, 10153-10156.
-
(2011)
Angew Chem Int Ed
, vol.50
, pp. 10153-10156
-
-
Hansen, L.P.1
Ramasse, Q.M.2
Kisielowski, C.3
Brorson, M.4
Johnson, E.5
Topsøe, H.6
Helveg, S.7
-
15
-
-
0029003107
-
The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules
-
Henderson, R.1995!. The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules. Q Rev Biophys 28, 171-193.
-
(1995)
Q Rev Biophys
, vol.28
, pp. 171-193
-
-
Henderson, R.1
-
16
-
-
1842420652
-
Hunting the Stobbs factor
-
Howie, A.2004!. Hunting the Stobbs factor. Ultramicroscopy 98, 73-79.
-
(2004)
Ultramicroscopy
, vol.98
, pp. 73-79
-
-
Howie, A.1
-
17
-
-
1842577739
-
Resolution extension and exit wave reconstruction in complex HREM
-
Hsieh, W.-K., Chen, F.-R., Kai, J.-J. & Kirkland, A.I.2004!. Resolution extension and exit wave reconstruction in complex HREM. Ultramicroscopy 98, 99-114.
-
(2004)
Ultramicroscopy
, vol.98
, pp. 99-114
-
-
Hsieh, W.-K.1
Chen, F.-R.2
Kai, J.-J.3
Kirkland, A.I.4
-
18
-
-
0028401555
-
Quantitative comparison of high resolution TEM images with image simulations
-
Hytch, M.J. & Stobbs, W.M.1994!. Quantitative comparison of high resolution TEM images with image simulations. Ultramicroscopy 53, 63-72.
-
(1994)
Ultramicroscopy
, vol.53
, pp. 63-72
-
-
Hytch, M.J.1
Stobbs, W.M.2
-
19
-
-
68349114804
-
First application of Cc-corrected imaging for high-resolution and energy-filtered TEM
-
Kabius, B., Hartel, P., Haider, M., Müller, H., Uhlemann, S., Loebau, U., Zach, J. & Rose, H.2009!. First application of Cc-corrected imaging for high-resolution and energy-filtered TEM. J Electron Microsc 58, 147-155.
-
(2009)
J Electron Microsc
, vol.58
, pp. 147-155
-
-
Kabius, B.1
Hartel, P.2
Haider, M.3
Müller, H.4
Uhlemann, S.5
Loebau, U.6
Zach, J.7
Rose, H.8
-
20
-
-
79960672916
-
Transmission electron microscopy at 20 kV for imaging and spectroscopy
-
Kaiser, U., Biskupek, J., Meyer, J.C., Leschner, J., Lechner, L., Rose, H., Stöger-Pollach, M., Khlobystov, A.N., Hartel, P., Müller, H., Haider, M., Eyhusen, S. & Benner, G.2011!. Transmission electron microscopy at 20 kV for imaging and spectroscopy. Ultramicroscopy 111, 1239-1246.
-
(2011)
Ultramicroscopy
, vol.111
, pp. 1239-1246
-
-
Kaiser, U.1
Biskupek, J.2
Meyer, J.C.3
Leschner, J.4
Lechner, L.5
Rose, H.6
Stöger-Pollach, M.7
Khlobystov, A.N.8
Hartel, P.9
Müller, H.10
Haider, M.11
Eyhusen, S.12
Benner, G.13
-
21
-
-
0000964068
-
Binary-encounter-dipole model for electron-impact ionization
-
Kim, Y.-K. & Rudd, M.E.1994!. Binary-encounter-dipole model for electron-impact ionization. Phys Rev A 50, 3954-3967.
-
(1994)
Phys Rev A
, vol.50
, pp. 3954-3967
-
-
Kim, Y.-K.1
Rudd, M.E.2
-
22
-
-
52149103148
-
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscopy with 0.5 Å information limit
-
Kisielowski, C., Freitag, B., Bischoff, M., van Lin, H., Lazar, S., Knippels, G., Tiemeijer, P., van der Stam, M., von Harrach, S., Stekelenburg, M., Haider, M., Muller, H., Hartel, P., Kabius, B., Miller, D., Petrov, I., Olson, E., Donchev, T., Kenik, E.A., Lupini, A., Bentley, J., Pennycook, S., Minor, A.M., Schmid, A.K., Duden, T., Radmilovic, V., Ramasse, Q., Erni, R.,Watanabe, M., Stach, E., Denes, P. & Dahmen, U.2008!. Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscopy with 0.5 Å information limit. Microsc Microanal 14, 454-462.
-
(2008)
Microsc Microanal
, vol.14
, pp. 454-462
-
-
Kisielowski, C.1
Freitag, B.2
Bischoff, M.3
Van Lin, H.4
Lazar, S.5
Knippels, G.6
Tiemeijer, P.7
Van Der Stam, M.8
Von Harrach, S.9
Stekelenburg, M.10
Haider, M.11
Muller, H.12
Hartel, P.13
Kabius, B.14
Miller, D.15
Petrov, I.16
Olson, E.17
Donchev, T.18
Kenik, E.A.19
Lupini, A.20
Bentley, J.21
Pennycook, S.22
Minor, A.M.23
Schmid, A.K.24
Duden, T.25
Radmilovic, V.26
Ramasse, Q.27
Erni R.Watanabe, M.28
Stach, E.29
Denes, P.30
Dahmen, U.31
more..
-
23
-
-
0035182846
-
Imaging columns of the light elements C, N, and O with sub-Angstrom resolution
-
Kisielowski, C., Hetherington, C.J.D., Wang, Y.C., Kilaas, R., O'Keefe, M.A. & Thust, A.2001!. Imaging columns of the light elements C, N, and O with sub-Angstrom resolution. Ultramicroscopy 89, 243-263.
-
(2001)
Ultramicroscopy
, vol.89
, pp. 243-263
-
-
Kisielowski, C.1
Hetherington, C.J.D.2
Wang, Y.C.3
Kilaas, R.4
O'Keefe, M.A.5
Thust, A.6
-
25
-
-
84879002721
-
-
The University of Erlangen
-
Specht, P., Wetherford, T.R., Kiesel, P., Marek, T. & Malzer, S.Eds.!, pp. 137-144. Erlangen- Nuernberg: The University of Erlangen
-
Erlangen- Nuernberg
, pp. 137-144
-
-
Specht, P.1
Wetherford, T.R.2
Kiesel, P.3
Marek, T.4
Malzer, S.5
-
26
-
-
77950469221
-
Imaging MoS2 nanocatalysts with single-atom sensitivity
-
Kisielowski, C., Ramasse, Q., Hansen, L.P., Brorson, M., Carlsson, A.,Molenbroek, A.M., Topsoe, H. & Helveg, S.2010a!. Imaging MoS2 nanocatalysts with single-atom sensitivity. Angew Chem Int Ed 49, 2708-2710.
-
(2010)
Angew Chem Int Ed
, vol.49
, pp. 2708-2710
-
-
Kisielowski, C.1
Ramasse, Q.2
Hansen, L.P.3
Brorson, M.4
Carlsson, A.5
Molenbroek, A.M.6
Topsoe, H.7
Helveg, S.8
-
27
-
-
81455130740
-
Aberration-corrected electron microscopy imaging for nanoelectronics applications
-
Kisielowski, C., Specht, P., Alloyeau, D., Erni, R. & Ramasse, Q.2009!. Aberration-corrected electron microscopy imaging for nanoelectronics applications. In Frontiers of Characterization and Metrology for Nanoelectronics
-
(2009)
Frontiers of Characterization and Metrology for Nanoelectronics
-
-
Kisielowski, C.1
Specht, P.2
Alloyeau, D.3
Erni, R.4
Ramasse, Q.5
-
28
-
-
84878970538
-
-
1173 Melville NY: American Institute of Physics
-
Seiler, D.G., Diebold, A.C., McDonald, R., Garner, C.M., Herr, D., Khosla, R.P. & Secula, E.M.Eds.!, pp. 231-241. American Institute of Physics Conference Proceedings 1173. Melville, NY: American Institute of Physics
-
American Institute of Physics Conference Proceedings
, pp. 231-241
-
-
Seiler, D.G.1
Diebold, A.C.2
McDonald, R.3
Garner, C.M.4
Herr, D.5
Khosla, R.P.6
Secula, E.M.7
-
29
-
-
84878966185
-
2010b!. Improving on phase contrast by harvesting more spatial frequencies at different acceleration voltages
-
Brazil, September
-
Kisielowski, C, Specht, P., Barton, B. & Jiang, B.2010b!. Improving on phase contrast by harvesting more spatial frequencies at different acceleration voltages. In Proceedings of the 17th International Microscopy Congress, Rio de Janeiro, Brazil, September 19-24, 2010.
-
Proceedings of the 17th International Microscopy Congress, Rio de Janeiro
, vol.2010
, pp. 19-24
-
-
Kisielowski, C.1
Specht, P.2
Barton, B.3
Jiang, B.4
-
30
-
-
2442535073
-
The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imaging
-
Lentzen, M.2004!. The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imaging. Ultramicroscopy 99, 211-220.
-
(2004)
Ultramicroscopy
, vol.99
, pp. 211-220
-
-
Lentzen, M.1
-
31
-
-
0037044862
-
Macromolecular architecture in eukaryotic cells visualized by cryoelectron tomography
-
Medalia, O.,Weber, I., Frangakis, A.S., Nicastro, D., Gerisch, G. & Baumeister, W.2002!. Macromolecular architecture in eukaryotic cells visualized by cryoelectron tomography. Science 298, 1209-1213.
-
(2002)
Science
, vol.298
, pp. 1209-1213
-
-
Medalia, O.1
Weber, I.2
Frangakis, A.S.3
Nicastro, D.4
Gerisch, G.5
Baumeister, W.6
-
32
-
-
0035186113
-
Sub-Ångström high-resolution transmission electron microscopy at 300 keV
-
O'Keefe, M.A., Hetherington, C.J.D.,Wang, Y.C., Nelson, E.C., Turner, J.H., Kisielowski, C., Malm, J.-O., Mueller, R., Ringnalda, J., Pan, M. & Thust, A.2001!. Sub-Ångström high-resolution transmission electron microscopy at 300 keV. Ultramicroscopy 89, 215-241.
-
(2001)
Ultramicroscopy
, vol.89
, pp. 215-241
-
-
O'Keefe, M.A.1
Hetherington, C.J.D.2
Wang, Y.C.3
Nelson, E.C.4
Turner, J.H.5
Kisielowski, C.6
Malm, J.-O.7
Mueller, R.8
Ringnalda, J.9
Pan, M.10
Thust, A.11
-
33
-
-
70349436154
-
Future trends in aberration-corrected electron microscopy
-
Rose, H.2009!. Future trends in aberration-corrected electron microscopy. Phil Trans R Soc A 367, 3809-3823.
-
(2009)
Phil Trans R Soc A
, vol.367
, pp. 3809-3823
-
-
Rose, H.1
-
34
-
-
80054010961
-
Chromatic aberration correction by combination concave lens
-
Sawada, H., Hosokava, F., Sasaki, T., Yuasa, S., Kawazoe, M., Terao, M., Kaneyama, T., Kondo, Y., Kimoto, K. & Suenaga, K.2010!. Chromatic aberration correction by combination concave lens. Microsc Microanal 16, 116-117.
-
(2010)
Microsc Microanal
, vol.16
, pp. 116-117
-
-
Sawada, H.1
Hosokava, F.2
Sasaki, T.3
Yuasa, S.4
Kawazoe, M.5
Terao, M.6
Kaneyama, T.7
Kondo, Y.8
Kimoto, K.9
Suenaga, K.10
-
35
-
-
4243309241
-
Electron-spectrometric study of amorphous germanium and silicon in the two-phonon region
-
Schroeder, B. & Geiger, J.1972!. Electron-spectrometric study of amorphous germanium and silicon in the two-phonon region. Phys Rev Lett 28, 301-303.
-
(1972)
Phys Rev Lett
, vol.28
, pp. 301-303
-
-
Schroeder, B.1
Geiger, J.2
-
37
-
-
84868532812
-
Direct imaging of rhodium crystal surface structures with signal recovery by low dose microscopy
-
Specht, P., Barton, D., Kang, J., Cieslinski, R., Dubon, O. & Kisielowski, C.2011a!. Direct imaging of rhodium crystal surface structures with signal recovery by low dose microscopy. Microsc Microanal 17 (S2!, 1064-1065.
-
(2011)
Microsc Microanal
, vol.17
, Issue.S2
, pp. 1064-1065
-
-
Specht, P.1
Barton, D.2
Kang, J.3
Cieslinski, R.4
Dubon, O.5
Kisielowski, C.6
-
38
-
-
80051820159
-
Quantitative contrast evaluation of an industry-style rhodium nanocatalyst with single atom sensitivity
-
Specht, P., Gulotty, R.J., Barton, D., Cieslinski, R., Rozeveld, S., Kang, J.H., Dubon, O.D. & Kisielowski, C.2011b!. Quantitative contrast evaluation of an industry-style rhodium nanocatalyst with single atom sensitivity. Chem Cat Chem 3, 1034-1037.
-
(2011)
Chem Cat Chem
, vol.3
, pp. 1034-1037
-
-
Specht, P.1
Gulotty, R.J.2
Barton, D.3
Cieslinski, R.4
Rozeveld, S.5
Kang, J.H.6
Dubon, O.D.7
Kisielowski, C.8
-
39
-
-
84857132882
-
Using a monochromator to improve the resolution in TEM to below 0.5 A. Part I: Creating highly coherent monochromated illumination
-
Tiemeijer, P.C., Bischoff, M., Freitag, B. & Kisielowski, C.2012!. Using a monochromator to improve the resolution in TEM to below 0.5 A. Part I: Creating highly coherent monochromated illumination. Ultramicroscopy 114, 72-81.
-
(2012)
Ultramicroscopy
, vol.114
, pp. 72-81
-
-
Tiemeijer, P.C.1
Bischoff, M.2
Freitag, B.3
Kisielowski, C.4
-
40
-
-
33847136275
-
Electron channelling based crystallography
-
Van Aert, S., Geuens, P., Van Dyck, D., Kisielowski, C. & Jinschek, J.R.2007!. Electron channelling based crystallography. Ultramicroscopy 107, 551-558.
-
(2007)
Ultramicroscopy
, vol.107
, pp. 551-558
-
-
Van Aert, S.1
Geuens, P.2
Van Dyck, D.3
Kisielowski, C.4
Jinschek, J.R.5
-
41
-
-
34347399291
-
Electron knock-on cross section of carbon and boron nitride nanotubes
-
Zobelli, A., Gloter, A., Ewels, C., Seifert, G. & Colliex, C.2007!. Electron knock-on cross section of carbon and boron nitride nanotubes. Phys Rev B 75, 245402.
-
(2007)
Phys Rev B
, vol.75
, pp. 245402
-
-
Zobelli, A.1
Gloter, A.2
Ewels, C.3
Seifert, G.4
Colliex, C.5
|