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Physical Review Letters

Volumn 111, Issue 4, 2013, Pages

Thermal magnetic field noise limits resolution in transmission electron microscopy

(5) Uhlemann, Stephan a Müller, Heiko a Hartel, Peter a Zach, Joachim a Haider, Max a

a CEOS Corrected Electron Optical Systems GmbH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM ENERGIES; CONDUCTIVE PARTS; DECOHERENCE; DELETERIOUS EFFECTS; INFORMATION LIMITS; MAGNETIC FIELD NOISE; ROOT CAUSE; THERMALLY DRIVEN;

MAGNETIC FIELDS; TRANSMISSION ELECTRON MICROSCOPY;

INSTRUMENTS;

EID: 84880587231 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.111.046101 Document Type: Article

Times cited : (88)

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