Optimization of exit-plane waves restored from HRTEM through-focal series

Ultramicroscopy

Volumn 110, Issue 2, 2010, Pages 151-161

  Erni, Rolf ^a,b   Rossell, Marta D ^b,c   Nakashima, Philip N H ^d  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c ETH ZURICH   (Switzerland)

^d MONASH UNIVERSITY   (Australia)

Author keywords

Aberration correction; Exit plane wave; HRTEM; Modulation transfer function; Through focal series reconstruction

Indexed keywords

ABERRATION CORRECTION; ABERRATION CORRECTORS; ATOMIC-RESOLUTION; FOCAL SERIES RECONSTRUCTION; HIGHER ORDER; IMAGE CONTRASTS; IMAGING PROCESS; INFORMATION TRANSFERS; MODULATION TRANSFER FUNCTION; OPTICAL ELEMENTS; PLANE WAVE; SEMI-EMPIRICAL;

COMMUNICATION CHANNELS (INFORMATION THEORY); ELASTIC WAVES; FOCUSING; MODULATION; TRANSFER FUNCTIONS; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATIONS;

ACCURACY; ARTICLE; ATOMIC RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; GEOMETRY; IMAGE ANALYSIS; MICROSCOPE; MODULATION; PROCESS OPTIMIZATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 72749113504     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.10.015     Document Type: Article

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