Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media

Journal of Applied Physics

Volumn 116, Issue 13, 2014, Pages

  Umeda, Ken Ichi ^a   Kobayashi, Kei ^a,b   Oyabu, Noriaki ^a,c   Hirata, Yoshiki ^d   Matsushige, Kazumi ^a   Yamada, Hirofumi ^a  

^a KYOTO UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC DEVICES; MODULATION; NANOCANTILEVERS; PHASE INTERFACES; SURFACE CHARGE; SURFACE POTENTIAL;

ELECTROSTATIC FORCE MICROSCOPY; KELVIN PROBE FORCE MICROSCOPY; MEASUREMENT AND ANALYSIS; PARASITIC OSCILLATIONS; POTENTIAL DISTRIBUTIONS; SCANNING PROBE TECHNIQUES; SOLID/LIQUID INTERFACES; SURFACE STRESS EFFECTS;

ELECTROSTATIC FORCE;

EID: 84907833445     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4896881     Document Type: Article

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