Surface charge microscopy: Novel technique for mapping charge-mosaic surfaces in electrolyte solutions

Langmuir

Volumn 24, Issue 15, 2008, Pages 8013-8020

  Yin, Xihui ^a   Drelich, Jaroslaw ^a  

^a Michigan Technological University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; ANALYTICAL TOOLS; ELECTROKINETIC MEASUREMENTS; ELECTROL YTE SOLUTIONS; EXPERIMENTAL DATA; FLOW-THROUGH; FORCE-DISTANCE CURVES; GRADUAL TRANSITIONS; MATERIAL SURFACES; MOBILITY MEASUREMENTS; P H VALUES; REAL-WORLD SITUATIONS; SPATIALLY RESOLVED; STREAMING POTENTIAL; SURFACE CHARGE DENSITIES; SURFACE CHARGE DISTRIBUTIONS; SURFACE HETEROGENEITIES; SURFACE INTERACTIONS; TECHNOLOGICAL SIGNIFICANCE; THEORETICAL MODEL; TWO PHASES; TWO-DIMENSIONAL DISTRIBUTIONS;

ATOMIC FORCE MICROSCOPY; CHARGE DENSITY; CHARGE DISTRIBUTION; CHARGED PARTICLES; ELECTRIC FIELDS; ELECTROLYSIS; ELECTROLYTES; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS; ELECTROPHORETIC MOBILITY; FORCE MEASUREMENT; IMAGING TECHNIQUES; IONIC STRENGTH; IONIZATION OF LIQUIDS; MICROSCOPIC EXAMINATION; NITRIDES; NONMETALS; PHASE INTERFACES; PHOTORESISTS; SCANNING PROBE MICROSCOPY; SILICON; SILICON NITRIDE; SOLUTIONS; SURFACE POTENTIAL; SURFACE PROPERTIES; SURFACES; TWO DIMENSIONAL;

SURFACE CHARGE;

EID: 49649086488     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la801269z     Document Type: Article

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