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Volumn 107, Issue 12, 2007, Pages 1207-1212

Jumping mode AFM imaging of biomolecules in the repulsive electrical double layer

Author keywords

Atomic force microscope; Avidin; Electrical double layer; Jumping mode; Non contact imaging

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONCENTRATION (PROCESS); IMAGING SYSTEMS; PROTEINS; SOLUTIONS; SURFACE CHARGE;

EID: 34548289500     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.01.020     Document Type: Article
Times cited : (23)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.