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Volumn 107, Issue 12, 2007, Pages 1207-1212
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Jumping mode AFM imaging of biomolecules in the repulsive electrical double layer
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Author keywords
Atomic force microscope; Avidin; Electrical double layer; Jumping mode; Non contact imaging
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CONCENTRATION (PROCESS);
IMAGING SYSTEMS;
PROTEINS;
SOLUTIONS;
SURFACE CHARGE;
ION CONCENTRATION;
JUMPING OPERATION MODES;
NON CONTACT IMAGING;
REPULSIVE ELECTRICAL DOUBLE LAYERS;
BIOMOLECULES;
AVIDIN;
MICA;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
MICROSCOPE;
SURFACE CHARGE;
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EID: 34548289500
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2007.01.020 Document Type: Article |
Times cited : (23)
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References (28)
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