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Volumn 38, Issue 8, 2006, Pages 23-25
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Dielectrophoretic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CANTILEVER BEAMS;
DIELECTRIC DEVICES;
DIELECTRIC PROPERTIES;
FEEDBACK CONTROL;
OPTICAL RESOLVING POWER;
AQUEOUS CONDITIONS;
DIELECTROPHORETIC FORCE (DEP);
TAPPING-MODE IMAGING;
ULTRAHIGH RESOLUTION BIOLOGICAL MICROSCOPY;
IMAGING TECHNIQUES;
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EID: 33744978596
PISSN: 00447749
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Review |
Times cited : (1)
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References (7)
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