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Volumn 102, Issue 7, 2013, Pages

Bias controlled capacitive driven cantilever oscillation for high resolution dynamic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE CONTROL; CANTILEVER OSCILLATION; DC BIAS; DC VOLTAGE; DRIVING SYSTEMS; DYNAMIC FORCE MICROSCOPY; HIGH FREQUENCY; HIGH RESOLUTION; PRECISE MEASUREMENTS; THEORETICAL PREDICTION;

EID: 84874537653     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4793205     Document Type: Article
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.