Non-contact AFM imaging in Water using electrically driven cantilever vibration

Langmuir

Volumn 29, Issue 22, 2013, Pages 6762-6769

  Marchand, David J ^a   Hsiao, Erik ^a   Kim, Seong H ^a  

^a The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; APPLIED VOLTAGES; AQUEOUS ENVIRONMENT; CANTILEVER VIBRATIONS; MECHANICAL CONTACT; POTENTIAL DIFFERENCE; SEPARATION DISTANCES; VIBRATION AMPLITUDE;

ELECTRIC PROPERTIES; NANOCANTILEVERS; SURFACE TOPOGRAPHY;

ATOMIC FORCE MICROSCOPY;

EID: 84878649586     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la4002797     Document Type: Article

References (43)

1. Martin, Y.; Williams, C. C.; Wickramasinghe, H. K. atomic force microscope force mapping and profiling on a sub 100-A scale J. Appl. Phys. 1987, 61 (10) 4723-4729
2. Johnson, C. A.; Lenhoff, A. M. Adsorption of charged latex particles on mica studied by atomic force microscopy J. Colloid Interface Sci. 1996, 179 (2) 587-599
3. Plaschke, M.; Romer, J.; Klenze, R.; Kim, J. I. In situ AFM study of sorbed humic acid colloids at different pH Colloids Surf., A 1999, 160 (3) 269-279
4. Raghavan, D.; VanLandingham, M.; Gu, X.; Nguyen, T. Characterization of heterogeneous regions in polymer systems using tapping mode and force mode atomic force microscopy Langmuir 2000, 16 (24) 9448-9459
5. Miyatani, T.; Horii, M.; Rosa, A.; Fujihira, M.; Marti, O. Mapping of electrical double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy Appl. Phys. Lett. 1997, 71 (18) 2632-2634
6. Rotsch, C.; Radmacher, M. Mapping local electrostatic forces with the atomic force microscope Langmuir 1997, 13 (10) 2825-2832
7. Brett, A. M. O.; Chiorcea, A. M. Atomic force microscopy of DNA immobilized onto a highly oriented pyrolytic graphite electrode surface Langmuir 2003, 19 (9) 3830-3839
8. Ge, G. L.; Han, D.; Lin, D. Y.; Chu, W. G.; Sun, Y. X.; Jiang, L.; Ma, W. Y.; Wang, C. MAC mode atomic force microscopy studies of living samples, ranging from cells to fresh tissue Ultramicroscopy 2007, 107 (4-5) 299-307
9. Colchero, J.; Gil, A.; Baro, A. M. Resolution enhancement and improved data interpretation in electrostatic force microscopy Phys. Rev. B 2001, 64 (24) 24540301-24540311
10. Fujihira, M. Kelvin probe force microscopy of molecular surfaces Annu. Rev. Mater. Sci. 1999, 29, 353-380
11. Gil, A.; Colchero, J.; Gomez-Herrero, J.; Baro, A. M. Electrostatic force gradient signal: Resolution enhancement in electrostatic force microscopy and improved Kelvin probe microscopy Nanotechnology 2003, 14 (2) 332-340
12. Nonnenmacher, M.; Oboyle, M. P.; Wickramasinghe, H. K. Kelvin probe force microscopy Appl. Phys. Lett. 1991, 58 (25) 2921-2923
13. Luna, M.; Rieutord, F.; Melman, N. A.; Dai, Q.; Salmeron, M. Adsorption of water on alkali halide surfaces studied by scanning polarization force microscopy J. Phys. Chem. A 1998, 102 (34) 6793-6800
14. Salmeron, M. Scanning polarization force microscopy: A technique for studies of wetting phenomena at the nanometer scale Oil Gas Sci. Technol. 2001, 56 (1) 63-75
15. Hsiao, E.; Kim, D.; Kim, S. H. Effects of ionic side groups attached to polydimethylsiloxanes on lubrication of silicon oxide surfaces Langmuir 2009, 25 (17) 9814-9823
16. Hu, J.; Xiao, X. D.; Salmeron, M. Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers Appl. Phys. Lett. 1995, 67 (4) 476-478
17. Hu, J.; Xiao, X. D.; Ogletree, D. F.; Salmeron, M. Imaging the condensation and evaporation of molecularly thin-films of water with nanometer resolution Science 1995, 268 (5208) 267-269
18. Johnson, A. S.; Nehl, C. L.; Mason, M. G.; Hafner, J. H. Fluid electric force microscopy for charge density mapping in biological systems Langmuir 2003, 19 (24) 10007-10010
19. Yang, Y.; Mayer, K. M.; Hafner, J. H. Quantitative membrane electrostatics with the atomic force microscope Biophys. J. 2007, 92 (6) 1966-1974
20. Hou, W. C.; Chang, W. H.; Jiang, C. M. Qualitative distinction of carboxyl group distributions in pectins with ruthenium red Bot. Bull. Acad. Sin. 1999, 40 (2) 115-119
21. Lionetti, V.; Raiola, A.; Camardella, L.; Giovane, A.; Obel, N.; Pauly, M.; Favaron, F.; Cervone, F.; Bellincampi, D. Overexpression of pectin methylesterase inhibitors in Arabidopsis restricts fungal infection by Botrytis cinerea Plant Physiol. 2007, 143 (4) 1871-1880
22. Vorwerk, S.; Somerville, S.; Somerville, C. The role of plant cell wall polysaccharide composition in disease resistance Trends Plant Sci. 2004, 9 (4) 203-209
23. Mesquida, P.; Stemmer, A. Maskless nanofabrication using the electrostatic attachment of gold particles to electrically patterned surfaces Microelectron. Eng. 2002, 61-2, 671-674
24. Feick, J. D.; Velegol, D. Measurements of charge nonuniformity on polystyrene latex particles Langmuir 2002, 18 (9) 3454-3458
25. Feick, J. D.; Velegol, D. Reducing surface charge nonuniformity on individual particles through annealing Ind. Eng. Chem. Res. 2004, 43 (14) 3478-3483
26. Li, J. R.; Garno, J. C. Indirect modulation of nonmagnetic probes for force modulation atomic force microscopy Anal. Chem. 2009, 81 (4) 1699-1706
27. Chaturvedi, N.; Hsiao, E.; Velegol, D.; Kim, S. H. Maskless fabrication of nanowells using chemically reactive colloids Nano Lett. 2011, 11 (2) 672-676
28. Luna, M.; Ogletree, D. F.; Salmeron, M. A study of the topographic and electrical properties of self-assembled islands of alkylsilanes on mica using a combination of non-contact force microscopy techniques Nanotechnology 2006, 17 (7) S178-S184
29. Butt, H. J.; Cappella, B.; Kappl, M. Force measurements with the atomic force microscope: Technique, interpretation and applications Surf. Sci. Rep. 2005, 59 (1-6) 1-152
30. Garcia, R.; Perez, R. Dynamic atomic force microscopy methods Surf. Sci. Rep. 2002, 47 (6-8) 197-301
31. Hudlet, S.; Saintjean, M.; Roulet, B.; Berger, J.; Guthmann, C. Electrostatic forces between metallic tip and semiconductor surfaces J. Appl. Phys. 1995, 77 (7) 3308-3314
32. Butt, H. J. Electrostatic interaction in atomic force microscopy Biophys. J. 1991, 60 (4) 777-785
33. Sounart, T. L.; Michalske, T. A.; Zavadil, K. R. Frequency-dependent electrostatic actuation in microfluidic MEMS J. Microelectromech. Syst. 2005, 14, 125-133
34. Russel, W. B.; Saville, D. A.; Schowalter, W. R. Colloidal Dispersions; Cambridge University Press: Cambridge, 1989.
35. Bahukudumbi, P.; Everett, W. N.; Beskok, A.; Bevan, M. A.; Huff, G. H.; Lagoudas, D.; Ounaies, Z. Colloidal microstructures, transport, and impedance properties within interfacial microelectrodes Appl. Phys. Lett. 2007, 90 (22) 224102
36. Cappella, B.; Dietler, G. Force-distance curves by atomic force microscopy Surf. Sci. Rep. 1999, 34 (1-3) 1
37. Hakoda, M.; Hachisu, T.; Wakizaka, Y.; Mii, S.; Kitajima, N. Development of a method to analyze single cell activity by using dielectrophoretic levitation Biotechnol. Prog. 2005, 21 (6) 1748-1753
38. Kaler, K.; Jones, T. B.; Paul, R. Low-frequency micromotions of dep-levitated plant-protoplasts 0.1 J. Colloid Interface Sci. 1995, 175 (1) 108-117
39. Wakizaka, Y.; Hakoda, M.; Shiragami, N. Effect of electrode geometry on dielectrophoretic separation of cells Biochem. Eng. J. 2004, 20 (1) 13-19
40. Ziegler, D.; Rychen, J.; Naujoks, N.; Stemmer, A. Compensating electrostatic forces by single-scan Kelvin probe force microscopy Nanotechnology 2007, 18 (22) 225505
41. Liu, G. Y.; Xu, S.; Qian, Y. L. Nanofabrication of self-assembled monolayers using scanning probe lithography Acc. Chem. Res. 2000, 33 (7) 457-466
42. Xu, S.; Miller, S.; Laibinis, P. E.; Liu, G. Y. Fabrication of nanometer scale patterns within self-assembled monolayers by nanografting Langmuir 1999, 15 (21) 7244-7251
43. Morgan, H.; Green, N. G. AC Electrokinetics: colloids and nanoparticles. Research Studies Press LTD.: Baldock, Hertfordshire, England, 2003.