Stern potential and Debye length measurements in dilute ionic solutions with electrostatic force microscopy

Nanotechnology

Volumn 24, Issue 43, 2013, Pages

  Kumar, Bharat ^a   Crittenden, Scott R ^a  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC EXPRESSIONS; CAPACITIVE FORCES; DOUBLE LAYER FORCE; ELECTROSTATIC FORCE MICROSCOPY; IONIC SOLUTIONS; LINEARIZED POISSON-BOLTZMANN EQUATIONS; SAMPLE SURFACE; SECOND HARMONICS;

ATOMIC FORCE MICROSCOPY; VAN DER WAALS FORCES;

IONS;

EID: 84885354703     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/43/435701     Document Type: Article

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