Theory of amplitude modulated electrostatic force microscopy for dielectric measurements in liquids at MHz frequencies

Nanotechnology

Volumn 24, Issue 41, 2013, Pages

  Gramse, G ^a,b,c   Edwards, M A ^a,d   Fumagalli, L ^a,b   Gomila, G ^a,b  

^a INSTITUTE FOR BIOENGINEERING OF CATALONIA IBEC   (Spain)

^b UNIVERSITY OF BARCELONA   (Spain)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^d The University of North Carolina at Chapel Hill   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATED; APPLIED VOLTAGES; DIELECTRIC CHARACTERIZATION; DIELECTRIC MEASUREMENTS; ELECTROSTATIC FORCE MICROSCOPY; IONIC CONCENTRATIONS; RELATIVE DIELECTRIC CONSTANT; TIP-SAMPLE DISTANCE;

AMPLITUDE MODULATION; ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC FORCE;

LIQUIDS;

EID: 84884660911     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/41/415709     Document Type: Article

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