Choice of operating voltage for a transmission electron microscope

Ultramicroscopy

Volumn 145, Issue , 2014, Pages 85-93

  Egerton, R F ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Accelerating voltage; Contrast; Radiation damage; Resolution; STEM; TEM

Indexed keywords

ATOMS; IMAGE RESOLUTION; OPTICAL RESOLVING POWER; PETROLEUM TAR; RADIATION CHEMISTRY; RADIATION DAMAGE; RADIOLYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION-CORRECTED; ACCELERATING VOLTAGES; CONTRAST; CORRECTION OF CHROMATIC ABERRATION; ELEMENTAL IDENTIFICATIONS; HIGH CURRENT DENSITIES; LOW ACCELERATING VOLTAGE; STEM;

ABERRATIONS;

ARTICLE; CONTRAST RADIOGRAPHY; ELECTRIC POTENTIAL; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPE; ENERGY TRANSFER; FLAME PHOTOMETRY; IMAGE ANALYSIS; IMAGE QUALITY; PARTICLE SIZE; RADIATION DOSE; RADIOLYSIS; RADIOSENSITIVITY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPE; X RAY EMISSION SPECTROSCOPY; ELECTRICITY; PROCEDURES; RADIATION SCATTERING; SPECTROMETRY; STATISTICS AND NUMERICAL DATA; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRICITY; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; MICROSCOPY, ELECTRON, TRANSMISSION; SCATTERING, RADIATION; SPECTROMETRY, X-RAY EMISSION;

EID: 84905729014     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.10.019     Document Type: Article

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