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Volumn 111, Issue 8, 2011, Pages 1305-1315

Optimizing the phase shift and the cut-on periodicity of phase plates for TEM

Author keywords

Artifacts; Cryo EM; Cut on periodicity; Phase plate; Phase shift

Indexed keywords

ARTIFACTS; BASIC PARAMETERS; CRYO-EM; CUT-ON PERIODICITY; FIGURES OF MERITS; LOW-FREQUENCY AMPLIFICATION; NEGATIVE PHASE; NUMERICAL RESULTS; PHASE CONTRASTS; PHASE PLATE; SOFTWARE SOLUTION; THEORETICAL RESULT; THEORETICAL STUDY;

EID: 80051827186     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.04.004     Document Type: Article
Times cited : (47)

References (18)
  • 16
    • 80051827089 scopus 로고    scopus 로고
    • Transmission Electron Microscopy: Physics of Image Formation and Microanalysis. fourth ed. Springer Series in Optical Sciences, Springer, Berlin, Heidelberg, New York,
    • L. Reimer, Transmission Electron Microscopy: Physics of Image Formation and Microanalysis. fourth ed. Springer Series in Optical Sciences, vol. 36, Springer, Berlin, Heidelberg, New York, 1997.
    • (1997) , vol.36
    • Reimer, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.