Convenient contrast enhancement by a hole-free phase plate

Ultramicroscopy

Volumn 118, Issue , 2012, Pages 77-89

  Malac, Marek ^a   Beleggia, Marco ^b   Kawasaki, Masahiro ^c   Li, Peng ^a   Egerton, Ray F ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c JEOL LTD   (Japan)

Author keywords

Charging; Contrast improvement; Contrast transfer function; Cryo TEM; Electron beam induced charging; Electron beam induced contamination; Low dose TEM; Phase plate; Radiation damage; Transmission electron microscope; Zernike phase plate

Indexed keywords

CONTRAST IMPROVEMENT; CONTRAST TRANSFER FUNCTION; CRYO-TEM; LOW DOSE; PHASE PLATE; TRANSMISSION ELECTRON MICROSCOPE; ZERNIKE PHASE;

CHARGING (FURNACE); IRRADIATION; RADIATION DAMAGE; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BEAMS;

ACCURACY; ARTICLE; CONTRAST ENHANCEMENT; ELECTRON BEAM; FIELD EMISSION; FILM DOSIMETER; HOLE FREE PHASE PLATE; IMAGING SYSTEM; INTERMETHOD COMPARISON; RADIATION BEAM; RADIATION DOSE DISTRIBUTION; SIGNAL NOISE RATIO;

COMPUTER SIMULATION; ELECTRONS; EQUIPMENT DESIGN; MICROSCOPY, ELECTRON, TRANSMISSION; MICROSCOPY, PHASE-CONTRAST; SIGNAL-TO-NOISE RATIO;

EID: 84862667787     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.02.004     Document Type: Article

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