A formula for the image intensity of phase objects in Zernike mode

Ultramicroscopy

Volumn 108, Issue 9, 2008, Pages 953-958

  Beleggia, Marco ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Electron microscopy; Phase contrast; Phase objects; Zernike phase plates

Indexed keywords

STANDARDS;

ANALYTICAL EXPRESSIONS; ELSEVIER (CO); GAUSSIAN; IMAGE CONTRASTS; IMAGE INTENSITIES; NEW YORK (CO); OPTIMIZATION CRITERION; PHASE OBJECTS; PHASE PLATES; PHASE STEPPING; SINUSOIDAL PHASE GRATINGS; ZERNIKE; ZERNIKE PHASE; ZERNIKE PHASE CONTRAST (ZPC);

BOOLEAN FUNCTIONS;

ARTICLE; CONTRAST ENHANCEMENT; ELECTRICITY; IMAGE ANALYSIS; IMAGE QUALITY; MATHEMATICAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 48149096901     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.03.003     Document Type: Article

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