Quantitative analysis of image contrast in phase contrast STEM for low dose imaging

Ultramicroscopy

Volumn 110, Issue 10, 2010, Pages 1324-1331

  Sader, Kasim ^a,b,c   Brown, Andy ^a   Brydson, Rik ^a   Bleloch, Andrew ^b  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

^c NATIONAL INSTITUTE FOR MEDICAL RESEARCH   (United Kingdom)

Author keywords

Absolute image contrast; Beam induced specimen movement; Phase contrast STEM

Indexed keywords

ABERRATION-CORRECTED STEM; BEAM-INDUCED SPECIMEN MOVEMENT; BRIGHT FIELDS; BRIGHTFIELD; COLD FIELD EMISSIONS; COLLECTION ANGLE; DETECTION SYSTEM; DIFFERENT DAMAGES; ELECTRON FLUENCES; FIELD-EMISSION ELECTRONS; FREQUENCY DEPENDENT; IMAGE CAPTURES; IMAGE CONTRASTS; IN-PHASE; LOW DOSE; MODULATION TRANSFER FUNCTION; OPTIMISATIONS; PHASE CONTRASTS; PHASE-CONTRAST IMAGE; PHOTO MULTIPLIER TUBE; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPHERICAL ABERRATION CORRECTION; SPOT SCANNING; STEM IMAGES; TEM; TEM IMAGES;

ABERRATIONS; CHARGE COUPLED DEVICES; CLAY MINERALS; ELECTRON BEAMS; ELECTRON GUNS; ELECTRON IRRADIATION; ELECTRON TUBES; FERROELECTRIC DEVICES; FIELD EMISSION; IMAGE ANALYSIS; PHOTOMULTIPLIERS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

VERMICULITE;

ARTICLE; BRIGHT FIELD MICROSCOPY; CONTROLLED STUDY; ELECTRON BEAM; ELECTRON DIFFRACTION; ELECTRON RADIATION; ELECTRON TRANSPORT; FIELD EMISSION; IMAGE QUALITY; PHASE CONTRAST MICROSCOPY; PROCESS OPTIMIZATION; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO;

EID: 77956185373     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.06.008     Document Type: Article

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