Beam-induced motion of adatoms in the transmission electron microscope

Microscopy and Microanalysis

Volumn 19, Issue 2, 2013, Pages 479-486

  Egerton, R F ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

catalysts; knock on displacement; scattering cross sections; single atom imaging; STEM

Indexed keywords

EID: 84875413034     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612014274     Document Type: Article

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