-
2
-
-
0029379751
-
Correlations between ionization radiation effects in transmission electron microscopy
-
Cazaux J. 1995. Correlations between ionization radiation effects in transmission electron microscopy. Ultramicroscopy 60: 411-425.
-
(1995)
Ultramicroscopy
, vol.60
, pp. 411-425
-
-
Cazaux, J.1
-
3
-
-
49549133528
-
Sputtering in the high voltage electron microscope
-
Cherns D, Minter FJ, Nelson RS. 1976. Sputtering in the high voltage electron microscope. Nucl Instrum Meth 132: 369-376.
-
(1976)
Nucl Instrum Meth
, vol.132
, pp. 369-376
-
-
Cherns, D.1
Minter, F.J.2
Nelson, R.S.3
-
4
-
-
0018190240
-
Radiation damage in the high resolution electron microscopy of biological materials: A review
-
Cosslett VE. 1983 Radiation damage in the high resolution electron microscopy of biological materials: A review. J Microsc 113: 113-129.
-
(1983)
J Microsc
, vol.113
, pp. 113-129
-
-
Cosslett, V.E.1
-
6
-
-
85164043663
-
Control of radiation damage in the TEM
-
press).
-
Egerton RF. Control of radiation damage in the TEM. Ultramicroscopy (in press).
-
Ultramicroscopy
-
-
Egerton, R.F.1
-
7
-
-
0041491381
-
60) in the transmission electron microscope
-
60) in the transmission electron microscope. Appl Phys Lett 75: 1884-1886.
-
(1999)
Appl Phys Lett
, vol.75
, pp. 1884-1886
-
-
Egerton, R.F.1
Takeuchi, M.2
-
8
-
-
77955512199
-
Basic questions related to electron-induced sputtering in the TEM
-
Egerton RF, McLeod R, Wang F, Malac M. 2010. Basic questions related to electron-induced sputtering in the TEM. Ultramicroscopy 110: 991-997.
-
(2010)
Ultramicroscopy
, vol.110
, pp. 991-997
-
-
Egerton, R.F.1
McLeod, R.2
Wang, F.3
Malac, M.4
-
9
-
-
84855487909
-
Delocalized radiation damage in polymers
-
Egerton RF, Lazar S, Libera M. 2012. Delocalized radiation damage in polymers. Micron 43: 2-7.
-
(2012)
Micron
, vol.43
, pp. 2-7
-
-
Egerton, R.F.1
Lazar, S.2
Libera, M.3
-
10
-
-
84867925503
-
Electron spectroscopy from outside-Aloof beam or near field?
-
Garcia de Abajo FJ, Howie A. 1999. Electron spectroscopy from outside-Aloof beam or near field? Inst Phys Conf Ser 161: 327-330.
-
(1999)
Inst Phys Conf Ser
, vol.161
, pp. 327-330
-
-
Garcia de Abajo, F.J.1
Howie, A.2
-
11
-
-
0025071357
-
Cryo-protection of protein crystals against radiation damage in electron and X-ray diffraction
-
Henderson R. 1990. Cryo-protection of protein crystals against radiation damage in electron and X-ray diffraction. Proc R Soc Lond B 241: 6-8.
-
(1990)
Proc R Soc Lond B
, vol.241
, pp. 6-8
-
-
Henderson, R.1
-
12
-
-
0016654606
-
Transmission electron microscopy of extended defects in alkali halide crystals
-
Surface and Defect Properties of Solids, Roberts MW,Thomas JM, editors. London: The Chemical Society.
-
Hobbs LW. 1975.Transmission electron microscopy of extended defects in alkali halide crystals. In: Surface and Defect Properties of Solids, Roberts MW, Thomas JM, editors. London: The Chemical Society. p. 152.
-
(1975)
, pp. 152
-
-
Hobbs, L.W.1
-
13
-
-
0040046641
-
Radiation effects in analysis by TEM
-
Chapman JN,Craven AJ, editors. Edinburgh: SUSSP Publications.
-
Hobbs LW. 1984. Radiation effects in analysis by TEM. In: Chapman JN, Craven AJ, editors. Quantitative electron microscopy. Edinburgh: SUSSP Publications. pp. 399-445.
-
(1984)
Quantitative electron microscopy
, pp. 399-445
-
-
Hobbs, L.W.1
-
14
-
-
0020875819
-
Surface reactions and excitations
-
Howie A. 1983. Surface reactions and excitations. Ultramicroscopy 11: 141-148.
-
(1983)
Ultramicroscopy
, vol.11
, pp. 141-148
-
-
Howie, A.1
-
15
-
-
0022131876
-
Electron beam ionization damage processes in p-terphenyl
-
Howie A, Rocca FJ, Valdre U. 1985. Electron beam ionization damage processes in p-terphenyl. Phil Mag B 52: 751-757.
-
(1985)
Phil Mag B
, vol.52
, pp. 751-757
-
-
Howie, A.1
Rocca, F.J.2
Valdre, U.3
-
16
-
-
0022578580
-
Cryoprotection in electron microscopy
-
International Experimental Study Group. 1986. Cryoprotection in electron microscopy. J Microsc 141: 385-391.
-
(1986)
J Microsc
, vol.141
, pp. 385-391
-
-
International Experimental Study, G.1
-
17
-
-
0011075580
-
Interaction of 25 keV electrons with the nucleic acid bases, adenine, thymine, and uracil. II. Inner shell excitation and inelastic scattering cross sections
-
Isaacson M. 1972. Interaction of 25 keV electrons with the nucleic acid bases, adenine, thymine, and uracil. II. Inner shell excitation and inelastic scattering cross sections. J Chem Phys 56: 1813-1818.
-
(1972)
J Chem Phys
, vol.56
, pp. 1813-1818
-
-
Isaacson, M.1
-
18
-
-
0018407566
-
Electron beam induced damage or organic solids: Implications for analytical electron microscopy
-
Isaacson M. 1979. Electron beam induced damage or organic solids: Implications for analytical electron microscopy. Ultramicroscopy 4: 193-199.
-
(1979)
Ultramicroscopy
, vol.4
, pp. 193-199
-
-
Isaacson, M.1
-
19
-
-
0036735497
-
Electron irradiation induced phase decomposition in alkaline earth multi-component oxide glass
-
Jiang N, Silcox J. 2002. Electron irradiation induced phase decomposition in alkaline earth multi-component oxide glass. J Appl Phys 92: 2310-2316.
-
(2002)
J Appl Phys
, vol.92
, pp. 2310-2316
-
-
Jiang, N.1
Silcox, J.2
-
20
-
-
79960672916
-
Transmission electron microscope at 20 kV for imaging and spectroscopy
-
Kaiser U, Biskupek J, Meyer JC, Leschner J, Lechner L, Rose H, Stöger-Pollach M, Khlobystov AN, Hartel P, Müller H, Haider M, Eyhusen S, Benner G. 2011. Transmission electron microscope at 20 kV for imaging and spectroscopy. Ultramicroscopy 111: 1239-1246.
-
(2011)
Ultramicroscopy
, vol.111
, pp. 1239-1246
-
-
Kaiser, U.1
Biskupek, J.2
Meyer, J.C.3
Leschner, J.4
Lechner, L.5
Rose, H.6
Stöger-Pollach, M.7
Khlobystov, A.N.8
Hartel, P.9
Müller, H.10
Haider, M.11
Eyhusen, S.12
Benner, G.13
-
21
-
-
84871499348
-
Gentle STEM of single atoms: Low keV imaging and analysis at ultimate detection limits
-
Bell D,Erdman N, editors. Oxford: Royal Microscopical Society (in press).
-
Krivanek OL, Zhou W, Chisholm MF, Dellby N, Lovejoy TC, Ramasse QM, Idrobo JC. 2012. Gentle STEM of single atoms: Low keV imaging and analysis at ultimate detection limits. In: Bell D, Erdman N, editors. Low voltage electron microscopy: Principles and applications. Oxford: Royal Microscopical Society (in press).
-
(2012)
Low voltage electron microscopy: Principles and applications
-
-
Krivanek, O.L.1
Zhou, W.2
Chisholm, M.F.3
Dellby, N.4
Lovejoy, T.C.5
Ramasse, Q.M.6
Idrobo, J.C.7
-
22
-
-
77957581412
-
Electron knock-on damage in hexagonal boron nitride monolayers
-
Kotakoski J, Jin CH, Lehtinen O, Suenaga K, Krasheninnikov AV. 2010. Electron knock-on damage in hexagonal boron nitride monolayers. Phys Rev B 82: 113404.
-
(2010)
Phys Rev B
, vol.82
, pp. 113404
-
-
Kotakoski, J.1
Jin, C.H.2
Lehtinen, O.3
Suenaga, K.4
Krasheninnikov, A.V.5
-
24
-
-
0016574277
-
Deep UV lithography
-
Lin BJ. 1975. Deep UV lithography. J Vac Sci Technol 12: 1317-1320.
-
(1975)
J Vac Sci Technol
, vol.12
, pp. 1317-1320
-
-
Lin, B.J.1
-
25
-
-
84870429476
-
Zur Streuung mittelschneller Elektronen in kleinste Winkel
-
9A
-
Lenz F. 1954. Zur Streuung mittelschneller Elektronen in kleinste Winkel. Z Naturforsch 9A: 185-204.
-
(1954)
Z Naturforsch
, pp. 185-204
-
-
Lenz, F.1
-
26
-
-
84860717107
-
An accurate measurement of electron beam induced displacement cross sections for single-layer graphene
-
Meyer JC, Eder F, Kurasch S, Skakalova V, Kotakoski J, Park HJ, Roth S, Chuvilin A, Eyhusen S, Benner G, Krasheninnikov AV, Kaiser U. 2012. An accurate measurement of electron beam induced displacement cross sections for single-layer graphene. Phys Rev Lett 108:196102.
-
(2012)
Phys Rev Lett
, vol.108
, pp. 196102
-
-
Meyer, J.C.1
Eder, F.2
Kurasch, S.3
Skakalova, V.4
Kotakoski, J.5
Park, H.J.6
Roth, S.7
Chuvilin, A.8
Eyhusen, S.9
Benner, G.10
Krasheninnikov, A.V.11
Kaiser, U.12
-
27
-
-
0027557438
-
Low dose high resolution electron microscopy of zeolite materials with slow scan CCD camera
-
Pan M, Crozier PA. 1993. Low dose high resolution electron microscopy of zeolite materials with slow scan CCD camera. Ultramicroscopy 48: 332-340.
-
(1993)
Ultramicroscopy
, vol.48
, pp. 332-340
-
-
Pan, M.1
Crozier, P.A.2
-
28
-
-
0019026717
-
Study of single-electron excitations by electron microscopy II. Cathodoluminescence image contrast from localized energy transfers
-
Pennycook SJ, Howie A. 1980. Study of single-electron excitations by electron microscopy II. Cathodoluminescence image contrast from localized energy transfers. Phil Mag 41: 809-827.
-
(1980)
Phil Mag
, vol.41
, pp. 809-827
-
-
Pennycook, S.J.1
Howie, A.2
-
32
-
-
0035477499
-
Electron irradiation effects in single wall carbon nanotubes
-
Smith BW, Luzzi DE. 2001. Electron irradiation effects in single wall carbon nanotubes. J Appl Phys 90: 3509-3515.
-
(2001)
J Appl Phys
, vol.90
, pp. 3509-3515
-
-
Smith, B.W.1
Luzzi, D.E.2
-
33
-
-
0029757019
-
Nanolithography using fullerene films as an electron beam resist
-
Tada T, Kanayama T. 1996. Nanolithography using fullerene films as an electron beam resist. Jpn J Appl Phys 35: L63-L65.
-
(1996)
Jpn J Appl Phys
, vol.35
-
-
Tada, T.1
Kanayama, T.2
-
34
-
-
0022186781
-
Light-element analysis with electrons and X-rays in a high-resolution STEM
-
Thomas LE. 1985. Light-element analysis with electrons and X-rays in a high-resolution STEM. Ultramicroscopy 18: 173-184.
-
(1985)
Ultramicroscopy
, vol.18
, pp. 173-184
-
-
Thomas, L.E.1
-
35
-
-
79951933523
-
Chemical distribution and chemical bonding of lithium in intercalated graphite: Identification with optimized electron energy loss spectroscopy
-
Wang F, Graetz J, Moreno MS, Ma C, Wu L, Volkov V, Zhu Y. 2011. Chemical distribution and chemical bonding of lithium in intercalated graphite: Identification with optimized electron energy loss spectroscopy. ACS Nano 5: 1190-1197.
-
(2011)
ACS Nano
, vol.5
, pp. 1190-1197
-
-
Wang, F.1
Graetz, J.2
Moreno, M.S.3
Ma, C.4
Wu, L.5
Volkov, V.6
Zhu, Y.7
-
36
-
-
0035519473
-
Energy deposition and transfer in electron-beam lithography
-
Wu B, Neureuther J. 2001. Energy deposition and transfer in electron-beam lithography. Vac Sci Technol B 19: 2508-2511.
-
(2001)
Vac Sci Technol B
, vol.19
, pp. 2508-2511
-
-
Wu, B.1
Neureuther, J.2
-
37
-
-
34347399291
-
Electron knock-on cross section of carbon and boron nitride nanotubes
-
Zobelli A, Gloter A, Ewels CP, Seifert G, Colliex C. 2007. Electron knock-on cross section of carbon and boron nitride nanotubes. Phys Rev B 75: 245402.
-
(2007)
Phys Rev B
, vol.75
, pp. 245402
-
-
Zobelli, A.1
Gloter, A.2
Ewels, C.P.3
Seifert, G.4
Colliex, C.5
|