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Volumn 16, Issue 2, 1985, Pages 139-150

Quantitative analysis of image contrast in electron micrographs of beam-sensitive crystals

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS - MICROSCOPIC EXAMINATION;

EID: 0021786909     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(85)90069-5     Document Type: Article
Times cited : (159)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.