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Volumn 16, Issue 2, 1985, Pages 139-150
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Quantitative analysis of image contrast in electron micrographs of beam-sensitive crystals
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS - MICROSCOPIC EXAMINATION;
BEAM-SENSITIVE CRYSTALS;
ELECTRON MICROGRAPHS;
IMAGE CONTRAST;
MICROSCOPES, ELECTRON;
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EID: 0021786909
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/0304-3991(85)90069-5 Document Type: Article |
Times cited : (159)
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References (22)
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