Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope

Ultramicroscopy

Volumn 110, Issue 5, 2010, Pages 563-570

  Alloyeau, D ^a   Hsieh, W K ^a   Anderson, E H ^a   Hilken, L ^a   Benner, G ^b   Meng, X ^c   Chen, F R ^d   Kisielowski, C ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b CARL ZEISS SMT AG   (Germany)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Electrostatic phase plate; In line holography; Phase contrast microscopy; Soft materials imaging; Wave reconstruction

Indexed keywords

IN-LINE HOLOGRAPHY; PHASE PLATE; PHASE-CONTRAST MICROSCOPY; SOFT MATERIAL; WAVE RECONSTRUCTION;

CARBON NANOTUBES; ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTROSTATICS; HARDNESS; HOLOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

CARBON NANOTUBE;

ARTICLE; CHEMICAL STRUCTURE; CONTRAST ENHANCEMENT; CONTROLLED STUDY; ELECTRODE; ELECTRON BEAM; ELECTRON MICROSCOPE; HOLOGRAPHY; OPTICAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77952321884     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.016     Document Type: Article

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