Transmission electron diffraction at 200 eV and damage thresholds below the carbon K edge

Microscopy and Microanalysis

Volumn 6, Issue 4, 2000, Pages 368-379

  Stevens, Michael R ^a   Chen, Qing ^a   Weierstall, Uwe ^a   Spence, John C H ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Aliphatic; Aromatic; Carbon K shell; Damage threshold; Low energy electron transmission

Indexed keywords

EID: 0040780426     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927602000636     Document Type: Article

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