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Volumn 254, Issue 3, 2014, Pages 109-114

Focused ion beam scanning electron microscopy in biology

Author keywords

Electron tomography; FIB SEM tomography; Focused ion beam scanning electron microscope

Indexed keywords

ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRONS; EPOXY RESINS; FOCUSED ION BEAMS; GALLIUM; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

EID: 84904738585     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12127     Document Type: Article
Times cited : (109)

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