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Volumn 183, Issue 1, 2013, Pages 11-18

In-situ integrity control of frozen-hydrated, vitreous lamellas prepared by the cryo-focused ion beam-scanning electron microscope

Author keywords

CEMOVIS; Cryo TEM tomography; FIB SEM; Transmission EBSD; TSEM; Yeast

Indexed keywords

ARTICLE; DIFFRACTION; ELECTRON BACK SCATTERED DIFFRACTION; ELECTRON BEAM; FOCUSED ION BEAM; LAMELLAR BODY; NONHUMAN; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPE; TRANSMISSION SCANNING ELECTRON MICROSCOPE; VITREOUS BODY; WORKFLOW;

EID: 84879885524     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2013.05.016     Document Type: Article
Times cited : (27)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.