Focused ion beam (FIB) combined with high resolution scanning electron microscopy: A promising tool for 3D analysis of chromosome architecture

Journal of Structural Biology

Volumn 165, Issue 2, 2009, Pages 97-106

  Schroeder Reiter, Elizabeth ^a   Pérez Willard, Fabián ^b   Zeile, Ulrike ^b   Wanner, Gerhard ^a  

^a UNIVERSITY OF MUNICH   (Germany)

^b CARL ZEISS SMT AG   (Germany)

Author keywords

Chromosomes; DNA; Field emission scanning electron microscopy (FESEM); Focused ion beam (FIB); Histones; Immunogold labeling

Indexed keywords

DNA; HISTONE;

ARTICLE; CENTROMERE; CHROMOSOME; ELECTRON; IMAGE RECONSTRUCTION; NONHUMAN; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING;

CENTROMERE; CHROMOSOMES; CHROMOSOMES, PLANT; DNA; HISTONES; HORDEUM; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; IMMUNOHISTOCHEMISTRY; IONS; METAPHASE; MICROSCOPY, ELECTRON, SCANNING; PHOSPHORYLATION;

HORDEUM;

EID: 58349118106     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2008.10.002     Document Type: Article

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