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Volumn 44, Issue 19, 2009, Pages 5182-5188

Nanoscale insight into the statics and dynamics of polarization behavior in thin film ferroelectric capacitors

Author keywords

[No Author keywords available]

Indexed keywords

FAST SWITCHING; FERROELECTRIC CAPACITORS; MECHANICAL STRESS; MICROMETER SCALE; NANO SCALE; POLARIZATION BEHAVIOR; POLARIZATION REVERSALS; POLARIZATION STABILITY; SCALING EFFECTS; THIN FILM FERROELECTRIC CAPACITORS;

EID: 68949166185     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-009-3623-4     Document Type: Article
Times cited : (19)

References (38)
  • 8
    • 68949191294 scopus 로고    scopus 로고
    • M. Alexe A. Gruverman (eds). Springer-Verlag Berlin
    • Alexe M, Gruverman A (eds) (2004) Nanoscale characterization of ferroelectric materials: scanning probe microscopy approach. Springer-Verlag, Berlin
    • (2004)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.