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Volumn 44, Issue 19, 2009, Pages 5182-5188
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Nanoscale insight into the statics and dynamics of polarization behavior in thin film ferroelectric capacitors
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Author keywords
[No Author keywords available]
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Indexed keywords
FAST SWITCHING;
FERROELECTRIC CAPACITORS;
MECHANICAL STRESS;
MICROMETER SCALE;
NANO SCALE;
POLARIZATION BEHAVIOR;
POLARIZATION REVERSALS;
POLARIZATION STABILITY;
SCALING EFFECTS;
THIN FILM FERROELECTRIC CAPACITORS;
CAPACITANCE;
FERROELECTRIC DEVICES;
FERROELECTRICITY;
POLARIZATION;
STRESSES;
CAPACITORS;
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EID: 68949166185
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-009-3623-4 Document Type: Article |
Times cited : (19)
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References (38)
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