Polarization-modulated rectification at ferroelectric surfaces

Physical Review Letters

Volumn 104, Issue 21, 2010, Pages

  Wu, Weida ^a   Guest, J R ^b   Horibe, Y ^a   Park, S ^c   Choi, T ^a   Cheong, S W ^a   Bode, M ^b  

^a RUTGERS UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Chung Ang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTANCE SPECTRA; CONDUCTIVE ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTION; ELECTROSTATIC FORCE MICROSCOPY; FERROELECTRIC DOMAIN STRUCTURE; FERROELECTRIC DOMAINS; FERROELECTRIC MEMORY; FERROELECTRIC SURFACES; LOW BIAS; LOW TEMPERATURES; NANO SCALE; NONDESTRUCTIVE READOUT; POLARIZATION-MODULATED; ROOM TEMPERATURE; SCHOTTKY; SHARP TIP; SPACE-CHARGE LIMITED CONDUCTION;

ATOMIC FORCE MICROSCOPY; ELECTRIC FORCE MICROSCOPY; ELECTRIC RECTIFIERS; ELECTROSTATIC FORCE; FERROELECTRIC MATERIALS; NANOSTRUCTURED MATERIALS; POLARIZATION; VISUALIZATION;

FERROELECTRICITY;

EID: 77953105322     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.104.217601     Document Type: Article

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