Scaling and disorder analysis of local I-V curves from ferroelectric thin films of lead zirconate titanate

Nanotechnology

Volumn 22, Issue 25, 2011, Pages

  Maksymovych, Peter ^a   Pan, Minghu ^a   Yu, Pu ^b   Ramesh, Ramamoorthy ^b   Baddorf, Arthur P ^a   Kalinin, Sergei V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS; BARRIER HEIGHTS; CANDIDATE MECHANISMS; DIFFERENTIAL ANALYSIS; ELECTRON TRANSPORT; ELECTRONIC TRANSPORT; FOWLER-NORDHEIM TUNNELING; HOPPING CONDUCTION; I - V CURVE; LEAD ZIRCONATE TITANATE; PHENOMENOLOGICAL ANALYSIS; SPATIAL VARIATIONS; SPATIALLY RESOLVED;

CURRENT VOLTAGE CHARACTERISTICS; EPITAXIAL FILMS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; LEAD; SCANNING PROBE MICROSCOPY; SEMICONDUCTING LEAD COMPOUNDS; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 79956110299     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/25/254031     Document Type: Article

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