A novel circuit for characteristics measurement of SiC transistors

Journal of Electrical Engineering and Technology

Volumn 9, Issue 4, 2014, Pages 1332-1342

  Cao, Guoen ^a   Kim, Hee Jun ^a  

^a Hanyang University   (South Korea)

Author keywords

Measurement; On state resistance; SiC; Test circuit

Indexed keywords

ELECTRICAL ENGINEERING; MEASUREMENTS;

ACCURATE MEASUREMENT; ACTIVE CLAMP CIRCUITS; DEVICE RELIABILITY; DYNAMIC MEASUREMENT METHODS; ON-STATE RESISTANCE; SIC; SWITCHING OPERATIONS; TEST CIRCUIT;

SILICON CARBIDE;

EID: 84902832369     PISSN: 19750102     EISSN: None     Source Type: Journal    
DOI: 10.5370/jeet.2014.9.4.1332     Document Type: Article

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